Noriyuki Kaneoka

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron beam device
- Patent number 11,515,121
- Issue date Nov 29, 2022
- HITACHI HIGH-TECH CORPORATION
- Tomohiko Ogata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor substrate for evaluation and method using same to eva...
- Patent number 11,193,895
- Issue date Dec 7, 2021
- HITACHI HIGH-TECH CORPORATION
- Kentaro Ohira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 11,107,655
- Issue date Aug 31, 2021
- Hitachi High-Technologies Corporation
- Tomohiko Ogata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection method and defect inspection device
- Patent number 11,002,687
- Issue date May 11, 2021
- HITACHI HIGH-TECH CORPORATION
- Masaki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus, and method of adjusting charged pa...
- Patent number 10,923,315
- Issue date Feb 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Masaki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and method for adjusting charged parti...
- Patent number 10,522,320
- Issue date Dec 31, 2019
- Hitachi High-Technologies Corporation
- Tomohiko Ogata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Presearch type document search method and apparatus
- Patent number 6,094,647
- Issue date Jul 25, 2000
- Hitachi, Ltd.
- Kanji Kato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hierarchical presearch type text search method and apparatus and ma...
- Patent number 5,519,857
- Issue date May 21, 1996
- Hitachi, Ltd.
- Kanji Kato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hierarchical presearch type text search method and apparatus and ma...
- Patent number 5,168,533
- Issue date Dec 1, 1992
- Hitachi, Ltd.
- Kanji Kato
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Substrate for Evaluation and Method Using Same to Eva...
- Publication number 20200340930
- Publication date Oct 29, 2020
- Hitachi High-Tech Corporation
- Kentaro OHIRA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Inspection Method and Defect Inspection Device
- Publication number 20200292466
- Publication date Sep 17, 2020
- Hitachi High-Technologies Corporation
- Masaki HASEGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20200279714
- Publication date Sep 3, 2020
- Hitachi High-Technologies Corporation
- Tomohiko OGATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Device
- Publication number 20200152415
- Publication date May 14, 2020
- Hitachi High-Technologies Corporation
- Tomohiko OGATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus, and Method of Adjusting Charged Pa...
- Publication number 20190378685
- Publication date Dec 12, 2019
- Hitachi High-Technologies Corporation
- Masaki HASEGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Method for Adjusting Charged Parti...
- Publication number 20190108969
- Publication date Apr 11, 2019
- Hitachi High-Technologies Corporation
- Tomohiko OGATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Defect Inspection Device
- Publication number 20190079025
- Publication date Mar 14, 2019
- Masaki HASEGAWA
- H01 - BASIC ELECTRIC ELEMENTS

Noriyuki Kaneoka

Person

Patents Grantslast 30 patents

Electron beam device

Semiconductor substrate for evaluation and method using same to eva...

Charged particle beam device

Defect inspection method and defect inspection device

Charged particle beam apparatus, and method of adjusting charged pa...

Charged particle beam device and method for adjusting charged parti...

Presearch type document search method and apparatus

Hierarchical presearch type text search method and apparatus and ma...

Hierarchical presearch type text search method and apparatus and ma...

Patents Applicationslast 30 patents

Semiconductor Substrate for Evaluation and Method Using Same to Eva...

Defect Inspection Method and Defect Inspection Device

Charged Particle Beam Device

Electron Beam Device

Charged Particle Beam Apparatus, and Method of Adjusting Charged Pa...

Charged Particle Beam Device and Method for Adjusting Charged Parti...

Defect Inspection Device