Membership
Tour
Register
Log in
Noriyuki Kato
Follow
Person
Kyoto, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Examination method, examination apparatus and examination program
Patent number
8,509,512
Issue date
Aug 13, 2013
Omron Corporation
Yoshihide Ota
G01 - MEASURING TESTING
Information
Patent Grant
X-ray inspecting apparatus and X-ray inspecting method
Patent number
8,391,581
Issue date
Mar 5, 2013
Omron Corporation
Masayuki Masuda
G01 - MEASURING TESTING
Information
Patent Grant
X-ray inspection apparatus and X-ray inspection method
Patent number
8,254,519
Issue date
Aug 28, 2012
Omron Corporation
Shinji Sugita
G01 - MEASURING TESTING
Information
Patent Grant
X-ray examination method and X-ray examination apparatus
Patent number
7,680,242
Issue date
Mar 16, 2010
Omron Corporation
Masayuki Masuda
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS
Publication number
20110255660
Publication date
Oct 20, 2011
Omron Corporation
Masayuki Masuda
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
Publication number
20110243299
Publication date
Oct 6, 2011
Omron Corporation
Shinji Sugita
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTING APPARATUS AND X-RAY INSPECTING METHOD
Publication number
20100329532
Publication date
Dec 30, 2010
OMRON CORPORATION
Masayuki Masuda
G01 - MEASURING TESTING
Information
Patent Application
EXAMINATION METHOD, EXAMINATION APPARATUS AND EXAMINATION PROGRAM
Publication number
20100172561
Publication date
Jul 8, 2010
OMRON CORPORATION
Yoshihide OTA
G06 - COMPUTING CALCULATING COUNTING