Noriyuki Masuda

Person

Tsukuba-shi, Ibaraki 305-8585, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for making three dimensional structures using photolithograp...
- Patent number 11,143,959
- Issue date Oct 12, 2021
- Mercene Labs AB
- Carl Fredrik Carlborg
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Test carrier for mounting and testing an electronic device
- Patent number 9,817,024
- Issue date Nov 14, 2017
- Advantest Corporation
- Hidenobu Matsumura
- G01 - MEASURING TESTING
Information Patent Grant
Test carrier
- Patent number 9,702,901
- Issue date Jul 11, 2017
- Advantest Corporation
- Kiyoto Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus and measuring method
- Patent number 9,140,734
- Issue date Sep 22, 2015
- Advantest Corporation
- Noriyuki Masuda
- G01 - MEASURING TESTING
Information Patent Grant
Isoquinoline derivatives or salts thereof
- Patent number 6,573,279
- Issue date Jun 3, 2003
- Toshihiro Watanabe
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Semiconductor test system
- Patent number 6,374,392
- Issue date Apr 16, 2002
- Advantest Corp.
- Katsumi Ochiai
- G01 - MEASURING TESTING
Information Patent Grant
Timing edge forming circuit for IC test system
- Patent number 6,032,282
- Issue date Feb 29, 2000
- Advantest Corp.
- Noriyuki Masuda
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern generator circuit for IC testing equipment
- Patent number 5,970,073
- Issue date Oct 19, 1999
- Advantest Corporation
- Noriyuki Masuda
- G01 - MEASURING TESTING
Information Patent Grant
Timing generating circuit and method
- Patent number 5,900,761
- Issue date May 4, 1999
- Advantest Corporation
- Seiji Hideno
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Temperature compensation circuit for IC chip
- Patent number 5,886,564
- Issue date Mar 23, 1999
- Advantest Corp.
- Masatoshi Sato
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Timing generator intended for semiconductor testing apparatus
- Patent number 5,488,325
- Issue date Jan 30, 1996
- Advantest Corporation
- Masatoshi Sato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MAKING THREE DIMENSIONAL STRUCTURES USING PHOTOLITHOGRAP...
- Publication number 20190227434
- Publication date Jul 25, 2019
- MERCENE LABS AB
- Carl Fredrik CARLBORG
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
TEST CARRIER
- Publication number 20160003869
- Publication date Jan 7, 2016
- Advantest Corporation
- Hidenobu MATSUMURA
- G01 - MEASURING TESTING
Information Patent Application
PHARMACEUTICAL COMPOSITION FOR TREATING OR PREVENTING STRESS URINAR...
- Publication number 20150368220
- Publication date Dec 24, 2015
- ASTELLAS PHARMA INC.
- Toru Watanabe
- G01 - MEASURING TESTING
Information Patent Application
TEST CARRIER
- Publication number 20150130492
- Publication date May 14, 2015
- Advantest Corporation
- Kiyoto Nakamura
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20130038340
- Publication date Feb 14, 2013
- Advantest Corporation
- Noriyuki MASUDA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS
- Publication number 20110015890
- Publication date Jan 20, 2011
- Advantest Corporation
- Hironaga YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
AGENT FOR TREATING ATRIAL FIBRILLATION
- Publication number 20090247572
- Publication date Oct 1, 2009
- Koichi Wada
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Noriyuki Masuda

Person

Patents Grantslast 30 patents

Method for making three dimensional structures using photolithograp...

Test carrier for mounting and testing an electronic device

Test carrier

Measuring apparatus and measuring method

Isoquinoline derivatives or salts thereof

Semiconductor test system

Timing edge forming circuit for IC test system

Test pattern generator circuit for IC testing equipment

Timing generating circuit and method

Temperature compensation circuit for IC chip

Timing generator intended for semiconductor testing apparatus

Patents Applicationslast 30 patents

METHOD FOR MAKING THREE DIMENSIONAL STRUCTURES USING PHOTOLITHOGRAP...

TEST CARRIER

PHARMACEUTICAL COMPOSITION FOR TREATING OR PREVENTING STRESS URINAR...

TEST CARRIER

MEASURING APPARATUS AND MEASURING METHOD

TEST APPARATUS

AGENT FOR TREATING ATRIAL FIBRILLATION