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Noriyuki Mitome

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  • Shimotsuke-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Foreign substance inspection apparatus
    • Patent number 7,986,403
    • Issue date Jul 26, 2011
    • Canon Kabushiki Kaisha
    • Noriyuki Mitome
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Foreign substance inspection apparatus
    • Patent number 7,733,471
    • Issue date Jun 8, 2010
    • Canon Kabushiki Kaisha
    • Noriyuki Mitome
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Position detecting device
    • Patent number 5,790,258
    • Issue date Aug 4, 1998
    • Canon Kabushiki Kaisha
    • Noriyuki Mitome
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Alignment method and semiconductor exposure method
    • Patent number 5,695,897
    • Issue date Dec 9, 1997
    • Canon Kabushiki Kaisha
    • Noriyuki Mitome
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Exposure apparatus
    • Patent number 5,172,189
    • Issue date Dec 15, 1992
    • Canon Kabushiki Kaisha
    • Noriyuki Mitome
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Alignment and exposure apparatus
    • Patent number 4,901,109
    • Issue date Feb 13, 1990
    • Canon Kabushiki Kaisha
    • Noriyuki Mitome
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents