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Noriyuki NAKANISHI
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Kakogawa-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Smear preparing apparatus, method of controlling smear preparing ap...
Patent number
11,592,365
Issue date
Feb 28, 2023
Sysmex Corporation
Junya Ikuta
G01 - MEASURING TESTING
Information
Patent Grant
Specimen smearing apparatus, specimen smearing method, smear sample...
Patent number
11,422,072
Issue date
Aug 23, 2022
Sysmex Corporation
Shogo Kubota
G01 - MEASURING TESTING
Information
Patent Grant
Smear staining apparatus, smear preparing apparatus, and smear stai...
Patent number
11,402,305
Issue date
Aug 2, 2022
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Smear preparation apparatus and smear preparation method
Patent number
11,287,355
Issue date
Mar 29, 2022
Sysmex Corporation
Junya Ikuta
G01 - MEASURING TESTING
Information
Patent Grant
Smear preparing apparatus and smear preparing method
Patent number
11,073,449
Issue date
Jul 27, 2021
Sysmex Corporation
Noriyuki Nakanishi
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Smear preparing apparatus and smear preparing method
Patent number
11,035,762
Issue date
Jun 15, 2021
Sysmex Corporation
Noriyuki Nakanishi
G01 - MEASURING TESTING
Information
Patent Grant
Sample measurement apparatus and method of measuring samples
Patent number
10,908,173
Issue date
Feb 2, 2021
Sysmex Corporation
Mitsuo Yamasaki
G01 - MEASURING TESTING
Information
Patent Grant
Specimen smearing apparatus, specimen smearing method, smear sample...
Patent number
10,801,929
Issue date
Oct 13, 2020
Sysmex Corporation
Shogo Kubota
G01 - MEASURING TESTING
Information
Patent Grant
Smearing member washing method and smear preparing apparatus
Patent number
10,792,710
Issue date
Oct 6, 2020
Sysmex Corporation
Mitsuo Yamasaki
C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information
Patent Grant
Sample processing apparatus and rack
Patent number
10,234,364
Issue date
Mar 19, 2019
SYSMEX CORPORATION
Takaaki Nagai
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Reagent preparing device, reagent preparing method, and specimen pr...
Patent number
10,161,950
Issue date
Dec 25, 2018
Sysmex Corporation
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer
Patent number
10,054,605
Issue date
Aug 21, 2018
Sysmex Corporation
Masaharu Shibata
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer and reagent container
Patent number
9,795,967
Issue date
Oct 24, 2017
Sysmex Corporation
Takaaki Nagai
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Sample processing apparatus and rack
Patent number
9,733,161
Issue date
Aug 15, 2017
SYSMEX CORPORATION
Takaaki Nagai
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Sample processing apparatus
Patent number
9,638,610
Issue date
May 2, 2017
SYSMEX CORPORATION
Takaaki Nagai
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Reagent preparation apparatus and sample processing apparatus
Patent number
9,482,682
Issue date
Nov 1, 2016
Sysmex Corporation
Yutaka Ikeda
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparation apparatus and specimen processing system
Patent number
9,316,660
Issue date
Apr 19, 2016
Sysmex Corporation
Tomoyuki Asahara
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer
Patent number
9,250,255
Issue date
Feb 2, 2016
SYSMEX CORPORATION
Masaharu Shibata
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparing device, reagent preparing method and specimen pro...
Patent number
9,207,250
Issue date
Dec 8, 2015
SYSMEX CORPORATION
Tomoyuki Asahara
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparing device, specimen processing system and reagent pr...
Patent number
9,164,021
Issue date
Oct 20, 2015
Sysmex Corporation
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparing device, specimen measuring device and reagent pre...
Patent number
8,906,302
Issue date
Dec 9, 2014
Sysmex Corporation
Noriyuki Nakanishi
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparing device and specimen processing system
Patent number
8,894,932
Issue date
Nov 25, 2014
Sysmex Corporation
Koichi Okubo
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparation apparatus, reagent preparation system, and reag...
Patent number
8,862,272
Issue date
Oct 14, 2014
Sysmex Corporation
Yutaka Ikeda
G01 - MEASURING TESTING
Information
Patent Grant
Reagent preparing apparatus, sample processing apparatus and reagen...
Patent number
8,511,888
Issue date
Aug 20, 2013
Sysmex Corporation
Takaaki Nagai
G05 - CONTROLLING REGULATING
Information
Patent Grant
Sample analysis system and reagent preparation device
Patent number
8,082,113
Issue date
Dec 20, 2011
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ANALYSIS METHOD, SPECIMEN ANALYZER, AND PROGRAM
Publication number
20240331814
Publication date
Oct 3, 2024
SYSMEX CORPORATION
Yuji MASUDA
Information
Patent Application
SPECIMEN ANALYZER AND SPECIMEN ANALYSIS METHOD
Publication number
20240302391
Publication date
Sep 12, 2024
SYSMEX CORPORATION
Kota Misawa
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN ANALYZER AND SPECIMEN PROCESSING SYSTEM
Publication number
20240302398
Publication date
Sep 12, 2024
SYSMEX CORPORATION
Noriyuki Nakanishi
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN ANALYZER, SPECIMEN ANALYSIS METHOD, AND PROGRAM
Publication number
20230338953
Publication date
Oct 26, 2023
SYSMEX CORPORATION
Konobu KIMURA
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SPECIMEN ANALYZER, SPECIMEN ANALYSIS METHOD, AND PROGRAM
Publication number
20230314457
Publication date
Oct 5, 2023
SYSMEX CORPORATION
Konobu KIMURA
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS AND ANALYSIS METHOD
Publication number
20230296522
Publication date
Sep 21, 2023
SYSMEX CORPORATION
Toshihiro MIZUKAMI
G01 - MEASURING TESTING
Information
Patent Application
REAGENT CONTAINER, REAGENT CONTAINER KIT, METHOD OF INSTALLING A RE...
Publication number
20230294099
Publication date
Sep 21, 2023
SYSMEX CORPORATION
Noriyuki NAKANISHI
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
QUALITY CONTROL SAMPLE MEASUREMENT METHOD, SAMPLE ANALYZER, AND SUP...
Publication number
20230168262
Publication date
Jun 1, 2023
SYSMEX CORPORATION
Junya IKUTA
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN SMEARING APPARATUS, SPECIMEN SMEARING METHOD, SMEAR SAMPLE...
Publication number
20220357245
Publication date
Nov 10, 2022
SYSMEX CORPORATION
Shogo KUBOTA
G01 - MEASURING TESTING
Information
Patent Application
SMEAR STAINING APPARATUS, SMEAR PREPARING APPARATUS, AND SMEAR STAI...
Publication number
20220357248
Publication date
Nov 10, 2022
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
WASHING METHOD FOR STAINING BATH IN SMEAR SAMPLE PREPARING APPARATU...
Publication number
20210116333
Publication date
Apr 22, 2021
SYSMEX CORPORATION
Junya IKUTA
G01 - MEASURING TESTING
Information
Patent Application
SMEAR PREPARATION APPARATUS AND SMEAR PREPARATION METHOD
Publication number
20200408653
Publication date
Dec 31, 2020
SYSMEX CORPORATION
Junya IKUTA
G01 - MEASURING TESTING
Information
Patent Application
SMEAR PREPARING APPARATUS, METHOD OF CONTROLLING SMEAR PREPARING AP...
Publication number
20200408650
Publication date
Dec 31, 2020
SYSMEX CORPORATION
Junya IKUTA
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN SMEARING APPARATUS, SPECIMEN SMEARING METHOD, SMEAR SAMPLE...
Publication number
20200348214
Publication date
Nov 5, 2020
SYSMEX CORPORATION
Shogo KUBOTA
G01 - MEASURING TESTING
Information
Patent Application
SMEAR STAINING APPARATUS, SMEAR PREPARING APPARATUS, AND SMEAR STAI...
Publication number
20180356319
Publication date
Dec 13, 2018
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
SMEARING MEMBER WASHING METHOD AND SMEAR PREPARING APPARATUS
Publication number
20180290181
Publication date
Oct 11, 2018
SYSMEX CORPORATION
Mitsuo YAMASAKI
C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information
Patent Application
SPECIMEN SMEARING APPARATUS, SPECIMEN SMEARING METHOD, SMEAR SAMPLE...
Publication number
20180188140
Publication date
Jul 5, 2018
SYSMEX CORPORATION
Shogo KUBOTA
G01 - MEASURING TESTING
Information
Patent Application
SMEAR PREPARING APPARATUS AND SMEAR PREPARING METHOD
Publication number
20180058989
Publication date
Mar 1, 2018
SYSMEX CORPORATION
Noriyuki NAKANISHI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS AND RACK
Publication number
20170363521
Publication date
Dec 21, 2017
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
SMEAR PREPARING APPARATUS AND SMEAR PREPARING METHOD
Publication number
20170343454
Publication date
Nov 30, 2017
SYSMEX CORPORATION
Noriyuki NAKANISHI
G02 - OPTICS
Information
Patent Application
SAMPLE MEASUREMENT APPARATUS AND METHOD OF MEASURING SAMPLES
Publication number
20170242046
Publication date
Aug 24, 2017
SYSMEX CORPORATION
Mitsuo YAMASAKI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER
Publication number
20160131674
Publication date
May 12, 2016
Sysmex Corporation
Masaharu SHIBATA
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER AND REAGENT CONTAINER
Publication number
20150273466
Publication date
Oct 1, 2015
SYSMEX CORPORATION
Takaaki NAGAI
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SAMPLE PROCESSING APPARATUS AND RACK
Publication number
20150185120
Publication date
Jul 2, 2015
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS
Publication number
20150185119
Publication date
Jul 2, 2015
SYSMEX CORPORATION
Takaaki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARATION APPARATUS AND SAMPLE PROCESSING APPARATUS
Publication number
20120237400
Publication date
Sep 20, 2012
Yutaka Ikeda
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARATION APPARATUS, REAGENT PREPARATION SYSTEM, AND REAG...
Publication number
20120031175
Publication date
Feb 9, 2012
SYSMEX CORPORATION
Yutaka IKEDA
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER
Publication number
20120003121
Publication date
Jan 5, 2012
Masaharu Shibata
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARATION APPARATUS AND SPECIMEN PROCESSING SYSTEM
Publication number
20110311396
Publication date
Dec 22, 2011
Tomoyuki Asahara
G01 - MEASURING TESTING
Information
Patent Application
REAGENT PREPARING APPARATUS
Publication number
20110184570
Publication date
Jul 28, 2011
Noriyuki Nakanishi
G01 - MEASURING TESTING