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Noriyuki Toriyama
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Probe for electro-optic sampling oscilloscope
Patent number
6,452,378
Issue date
Sep 17, 2002
Ando Electric Co., Ltd.
Noriyuki Toriyama
G01 - MEASURING TESTING
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Patent Grant
Electro-optic sampling probe
Patent number
6,347,005
Issue date
Feb 12, 2002
Ando Electric Co., Ltd.
Noriyuki Toriyama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PROBE FOR ELECTRO-OPTIC SAMPLING OSCILLOSCOPE
Publication number
20020140416
Publication date
Oct 3, 2002
Noriyuki Toriyama
G01 - MEASURING TESTING