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Norman C. Ford
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Amherst, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Measurement systems and methods for determining component particle...
Patent number
6,795,183
Issue date
Sep 21, 2004
Metron Instruments, Inc.
Michael G. O'Keeffe
G01 - MEASURING TESTING
Information
Patent Grant
Measurement systems and methods for determining component particle...
Patent number
6,407,813
Issue date
Jun 18, 2002
On-Line Instrumentation, Inc.
Spencer M. Lovette
G01 - MEASURING TESTING
Information
Patent Grant
High temperature light scattering measurement device comprising a r...
Patent number
5,701,176
Issue date
Dec 23, 1997
Precision Detectors, Inc.
Robert E. Dion
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for molecular characterization
Patent number
5,305,073
Issue date
Apr 19, 1994
Precision Detectors, Inc.
Norman C. Ford
G01 - MEASURING TESTING
Information
Patent Grant
Beam forming and sensing apparatus for aerodynamic particle sizing...
Patent number
4,938,592
Issue date
Jul 3, 1990
Amherst Process Instruments, Inc.
Trent A. Poole
G02 - OPTICS
Information
Patent Grant
Beam forming apparatus for aerodynamic particle sizing system
Patent number
4,917,494
Issue date
Apr 17, 1990
Amherst Process Instruments, Inc.
Trent A. Poole
G02 - OPTICS
Information
Patent Grant
Electrophoretic light scattering with plural reference beams, appar...
Patent number
4,648,715
Issue date
Mar 10, 1987
Langley-Ford Instruments a division of Coulter Electronics of N.E.
Norman C. Ford
G01 - MEASURING TESTING
Information
Patent Grant
Light scattering apparatus and method
Patent number
4,571,081
Issue date
Feb 18, 1986
Coulter Electronics of New England, Inc.
Norman C. Ford
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Measurement systems and methods for determining component particle...
Publication number
20030007150
Publication date
Jan 9, 2003
On-Line Instrumentation, Inc.
Michael G. O'Keeffe
G01 - MEASURING TESTING