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Norman Laman
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Kirkland, WA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Metrology system with position and orientation tracking utilizing l...
Patent number
12,174,005
Issue date
Dec 24, 2024
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Encoder
Patent number
11,774,270
Issue date
Oct 3, 2023
Mitutoyo Corporation
Norman Laman
G01 - MEASURING TESTING
Information
Patent Grant
Chromatic range sensor system for measuring workpiece thickness
Patent number
11,486,694
Issue date
Nov 1, 2022
Mitutoyo Corporation
Norman Laman
G01 - MEASURING TESTING
Information
Patent Grant
Contamination and defect resistant optical encoder configuration in...
Patent number
10,302,466
Issue date
May 28, 2019
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Contamination and defect resistant optical encoder configuration ou...
Patent number
10,295,378
Issue date
May 21, 2019
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Contamination and defect resistant optical encoder configuration in...
Patent number
10,295,648
Issue date
May 21, 2019
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Optical encoder configured to mitigate undesired interfering light...
Patent number
10,077,991
Issue date
Sep 18, 2018
Mitutoyo Corporation
Norman Laman
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
METROLOGY SYSTEM WITH POSITION AND ORIENTATION TRACKING UTILIZING L...
Publication number
20230204340
Publication date
Jun 29, 2023
MITUTOYO CORPORATION
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Application
ENCODER
Publication number
20230059800
Publication date
Feb 23, 2023
Mitutoyo Corporation
Norman Laman
G01 - MEASURING TESTING
Information
Patent Application
CHROMATIC RANGE SENSOR SYSTEM INCLUDING CAMERA
Publication number
20230032656
Publication date
Feb 2, 2023
MITUTOYO CORPORATION
Norman LAMAN
G01 - MEASURING TESTING
Information
Patent Application
CHROMATIC RANGE SENSOR SYSTEM FOR MEASURING WORKPIECE THICKNESS
Publication number
20220196388
Publication date
Jun 23, 2022
MITUTOYO CORPORATION
Norman LAMAN
G02 - OPTICS
Information
Patent Application
CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...
Publication number
20190003858
Publication date
Jan 3, 2019
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Application
CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...
Publication number
20190003859
Publication date
Jan 3, 2019
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Application
CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...
Publication number
20190004142
Publication date
Jan 3, 2019
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ENCODER CONFIGURED TO MITIGATE UNDESIRED INTERFERING LIGHT...
Publication number
20180087931
Publication date
Mar 29, 2018
MITUTOYO CORPORATION
Norman Laman
G02 - OPTICS