Noyoung CHUNG

Person

Hwaseong-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit device
- Patent number 12,159,832
- Issue date Dec 3, 2024
- Samsung Electronics Co., Ltd.
- Dawoon Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical proximity correction method and method of fabricating a sem...
- Patent number 11,733,604
- Issue date Aug 22, 2023
- Samsung Electronics Co., Ltd.
- Gyeong Seop Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and computing device for manufacturing semiconductor device
- Patent number 11,698,581
- Issue date Jul 11, 2023
- Samsung Electronics Co., Ltd.
- Akio Misaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask layout correction method and a method for fabricating semicond...
- Patent number 11,500,283
- Issue date Nov 15, 2022
- Samsung Electronics Co., Ltd.
- Narae Bang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing methods of semiconductor devices
- Patent number 11,092,885
- Issue date Aug 17, 2021
- Samsung Electronics Co., Ltd.
- Akio Misaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fabricating mask by performing optical proximity correction
- Patent number 10,031,410
- Issue date Jul 24, 2018
- Samsung Electronics Co., Ltd.
- Hyejin Shin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 9,996,658
- Issue date Jun 12, 2018
- Samsung Electronics Co., Ltd.
- Youngseok Kim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
REFLECTIVE MASK FOR EXTREME ULTRAVIOLET LITHOGRAPHY AND A METHOD OF...
- Publication number 20240219824
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- AKIO MISAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN DEFECT INSPECTION DEVICE AND PATTERN DEFECT INSPECTION METHOD
- Publication number 20240193755
- Publication date Jun 13, 2024
- Samsung Electronics Co., Ltd.
- Jungkee CHOI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LAYOUT METHOD OF SEMICONDUCTOR CHIP, SEMICONDUCTOR CHIP MANUFACTURI...
- Publication number 20230205963
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Akio Misaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20230075320
- Publication date Mar 9, 2023
- Samsung Electronics Co., Ltd.
- Noyoung CHUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL PROXIMITY CORRECTION METHOD, MASK MANUFACTURING METHOD AND...
- Publication number 20230071777
- Publication date Mar 9, 2023
- Samsung Electronics Co., Ltd.
- Wonjoo Im
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LITHOGRAPHY AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING TH...
- Publication number 20230055365
- Publication date Feb 23, 2023
- Samsung Electronics Co., Ltd.
- Wooseok KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT DEVICE
- Publication number 20220415782
- Publication date Dec 29, 2022
- Samsung Electronics Co., Ltd.
- Dawoon Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
- Publication number 20220292245
- Publication date Sep 15, 2022
- Samsung Electronics Co., Ltd.
- Akio MISAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME
- Publication number 20220216150
- Publication date Jul 7, 2022
- Samsung Electronics Co., Ltd.
- Jongchan Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND COMPUTING DEVICE FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20220121107
- Publication date Apr 21, 2022
- Samsung Electronics Co., Ltd.
- Akio MISAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL PROXIMITY CORRECTION METHOD AND METHOD OF FABRICATING A SEM...
- Publication number 20220057707
- Publication date Feb 24, 2022
- Samsung Electronics Co., Ltd.
- Gyeong Seop KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANUFACTURING METHODS OF SEMICONDUCTOR DEVICES
- Publication number 20210063867
- Publication date Mar 4, 2021
- Samsung Electronics Co., Ltd.
- Akio Misaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK LAYOUT CORRECTION METHOD AND A METHOD FOR FABRICATING SEMICOND...
- Publication number 20210063868
- Publication date Mar 4, 2021
- Samsung Electronics Co., Ltd.
- Narae Bang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
- Publication number 20170329888
- Publication date Nov 16, 2017
- Samsung Electronics Co., Ltd.
- YOUNGSEOK KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR FABRICATING MASK BY PERFORMING OPTICAL PROXIMITY CORRECTION
- Publication number 20170139317
- Publication date May 18, 2017
- Samsung Electronics Co., Ltd.
- Hyejin SHIN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Noyoung CHUNG

Person

Patents Grantslast 30 patents

Integrated circuit device

Optical proximity correction method and method of fabricating a sem...

Method and computing device for manufacturing semiconductor device

Mask layout correction method and a method for fabricating semicond...

Manufacturing methods of semiconductor devices

Method for fabricating mask by performing optical proximity correction

Method of manufacturing a semiconductor device

Patents Applicationslast 30 patents

REFLECTIVE MASK FOR EXTREME ULTRAVIOLET LITHOGRAPHY AND A METHOD OF...

PATTERN DEFECT INSPECTION DEVICE AND PATTERN DEFECT INSPECTION METHOD

LAYOUT METHOD OF SEMICONDUCTOR CHIP, SEMICONDUCTOR CHIP MANUFACTURI...

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

OPTICAL PROXIMITY CORRECTION METHOD, MASK MANUFACTURING METHOD AND...

LITHOGRAPHY AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING TH...

INTEGRATED CIRCUIT DEVICE

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME

METHOD AND COMPUTING DEVICE FOR MANUFACTURING SEMICONDUCTOR DEVICE

OPTICAL PROXIMITY CORRECTION METHOD AND METHOD OF FABRICATING A SEM...

MANUFACTURING METHODS OF SEMICONDUCTOR DEVICES

MASK LAYOUT CORRECTION METHOD AND A METHOD FOR FABRICATING SEMICOND...

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE

METHOD FOR FABRICATING MASK BY PERFORMING OPTICAL PROXIMITY CORRECTION