Numata MITSUNORI

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical device
- Patent number 11,761,906
- Issue date Sep 19, 2023
- Samsung Electronics Co., Ltd.
- Yasuhiro Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Pupil ellipsometry measurement apparatus and method and method of f...
- Patent number 11,604,136
- Issue date Mar 14, 2023
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G02 - OPTICS
Information Patent Grant
Imaging apparatus and imaging method
- Patent number 10,429,315
- Issue date Oct 1, 2019
- Samsung Electronics Co., Ltd.
- Akio Ishikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lighting apparatus, and optical inspection apparatus and optical mi...
- Patent number 9,594,240
- Issue date Mar 14, 2017
- Samsung Electronics Co., Ltd.
- Nobuyuki Kimura
- G02 - OPTICS
Information Patent Grant
Apparatus and method of inspecting a defect of an object
- Patent number 9,453,800
- Issue date Sep 27, 2016
- Samsung Electronics Co., Ltd.
- Akio Ishikawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION DEVICE
- Publication number 20240201104
- Publication date Jun 20, 2024
- Samsung Electronics Co., Ltd.
- KENJI SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...
- Publication number 20230204493
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Jaehwang JUNG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE
- Publication number 20220214288
- Publication date Jul 7, 2022
- Samsung Electronics Co., Ltd.
- Yasuhiro Hidaka
- G01 - MEASURING TESTING
Information Patent Application
PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...
- Publication number 20220074848
- Publication date Mar 10, 2022
- Samsung Electronics Co., Ltd.
- Jaehwang JUNG
- G01 - MEASURING TESTING
Information Patent Application
IMAGING APPARATUS AND IMAGING METHOD
- Publication number 20190025226
- Publication date Jan 24, 2019
- Samsung Electronics Co., Ltd.
- Akio ISHIKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIGHTING APPARATUS, AND OPTICAL INSPECTION APPARATUS AND OPTICAL MI...
- Publication number 20150160445
- Publication date Jun 11, 2015
- Samsung Electronics Co., Ltd.
- Nobuyuki KIMURA
- G02 - OPTICS
Information Patent Application
Apparatus and Method of Inspecting a Defect of an Object
- Publication number 20140185044
- Publication date Jul 3, 2014
- Samsung Electronics Co., Ltd.
- Akio Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
CONFOCAL OPTICAL INSPECTION APPARATUS AND CONFOCAL OPTICAL INSPECTI...
- Publication number 20140152797
- Publication date Jun 5, 2014
- Samsung Electronics Co., Ltd.
- Togashi MITSUHIRO
- G02 - OPTICS

Numata MITSUNORI

Person

Patents Grantslast 30 patents

Optical device

Pupil ellipsometry measurement apparatus and method and method of f...

Imaging apparatus and imaging method

Lighting apparatus, and optical inspection apparatus and optical mi...

Apparatus and method of inspecting a defect of an object

Patents Applicationslast 30 patents

INSPECTION DEVICE

PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...

OPTICAL DEVICE

PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...

IMAGING APPARATUS AND IMAGING METHOD

LIGHTING APPARATUS, AND OPTICAL INSPECTION APPARATUS AND OPTICAL MI...

Apparatus and Method of Inspecting a Defect of an Object

CONFOCAL OPTICAL INSPECTION APPARATUS AND CONFOCAL OPTICAL INSPECTI...