Oded COHEN

Person

Gedera, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Metrology and process control for semiconductor manufacturing
- Patent number 11,763,181
- Issue date Sep 19, 2023
- Nova Ltd.
- Eitan Rothstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test structure design for metrology measurements in patterned samples
- Patent number 11,639,901
- Issue date May 2, 2023
- Nova Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Test structure design for metrology measurements in patterned samples
- Patent number 11,143,601
- Issue date Oct 12, 2021
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology and process control for semiconductor manufacturing
- Patent number 11,093,840
- Issue date Aug 17, 2021
- Nova Measuring Instruments Ltd.
- Eitan Rothstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology test structure design and measurement scheme for measurin...
- Patent number 10,359,369
- Issue date Jul 23, 2019
- Nova Measuring Instruments Ltd.
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure for use in metrology measurements of patterns
- Patent number 10,216,098
- Issue date Feb 26, 2019
- Nova Measuring Instruments Ltd.
- Oded Cohen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for electrically pumped semiconductor evanescent laser
- Patent number 8,767,792
- Issue date Jul 1, 2014
- Intel Corporation
- John E. Bowers
- G02 - OPTICS
Information Patent Grant
Dual core corrugated Bragg grating
- Patent number 7,292,753
- Issue date Nov 6, 2007
- Intel Corporation
- Oded Cohen
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20240078450
- Publication date Mar 7, 2024
- NOVA LTD
- EITAN ROTHSTEIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES
- Publication number 20220099596
- Publication date Mar 31, 2022
- NOVA LTD
- GILAD BARAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20220036218
- Publication date Feb 3, 2022
- NOVA LTD
- EITAN ROTHSTEIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20210150387
- Publication date May 20, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- EITAN ROTHSTEIN
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES
- Publication number 20200057005
- Publication date Feb 20, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE FOR USE IN METROLOGY MEASUREMENTS OF PATTERNS
- Publication number 20170363970
- Publication date Dec 21, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Oded COHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METROLOGY TEST STRUCTURE DESIGN AND MEASUREMENT SCHEME FOR MEASURIN...
- Publication number 20170227474
- Publication date Aug 10, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES
- Publication number 20170146465
- Publication date May 25, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ELECTRICALLY PUMPED SEMICONDUCTOR EVANESCENT LASER
- Publication number 20130195137
- Publication date Aug 1, 2013
- John E. Bowers
- G02 - OPTICS
Information Patent Application
Electrically pumped semiconductor evanescent laser
- Publication number 20080002929
- Publication date Jan 3, 2008
- John E. Bowers
- G02 - OPTICS
Information Patent Application
Dual core corrugated bragg grating
- Publication number 20070140619
- Publication date Jun 21, 2007
- Oded Cohen
- G02 - OPTICS
Information Patent Application
Athermal bragg grating
- Publication number 20050220406
- Publication date Oct 6, 2005
- Richard Jones
- G02 - OPTICS

Person

Patents Grantslast 30 patents

Metrology and process control for semiconductor manufacturing

Test structure design for metrology measurements in patterned samples

Test structure design for metrology measurements in patterned samples

Metrology and process control for semiconductor manufacturing

Metrology test structure design and measurement scheme for measurin...

Test structure for use in metrology measurements of patterns

Method for electrically pumped semiconductor evanescent laser

Dual core corrugated Bragg grating

Patents Applicationslast 30 patents

METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING

TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES

METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING

METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING

TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES

TEST STRUCTURE FOR USE IN METROLOGY MEASUREMENTS OF PATTERNS

METROLOGY TEST STRUCTURE DESIGN AND MEASUREMENT SCHEME FOR MEASURIN...

TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES

METHOD FOR ELECTRICALLY PUMPED SEMICONDUCTOR EVANESCENT LASER

Electrically pumped semiconductor evanescent laser

Dual core corrugated bragg grating

Athermal bragg grating