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Oden Lee Warren
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New Brighton, MN, US
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Patents Grants
last 30 patents
Information
Patent Grant
Micro electro-mechanical heater
Patent number
9,759,641
Issue date
Sep 12, 2017
Hysitron, Inc.
Yunje Oh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microelectromechanical transducer and test system
Patent number
9,404,841
Issue date
Aug 2, 2016
Hysitron, Inc.
Yunje Oh
G01 - MEASURING TESTING
Information
Patent Grant
Micro electro-mechanical heater
Patent number
9,316,569
Issue date
Apr 19, 2016
Hysitron, Inc.
Yunje Oh
G01 - MEASURING TESTING
Information
Patent Grant
Micromachined comb drive for quantitative nanoindentation
Patent number
9,304,072
Issue date
Apr 5, 2016
Hysitron Incorporated
Yunje Oh
G01 - MEASURING TESTING
Information
Patent Grant
2-D MEMS tribometer with comb drives
Patent number
9,157,845
Issue date
Oct 13, 2015
Hysitron Incorporated
Yunje Oh
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Nanomechanical testing system
Patent number
8,959,980
Issue date
Feb 24, 2015
Hysitron, Inc.
David James Vodnick
G01 - MEASURING TESTING
Information
Patent Grant
Nanomechanical testing system
Patent number
8,939,041
Issue date
Jan 27, 2015
Hysitron, Inc.
David James Vodnick
G01 - MEASURING TESTING
Information
Patent Grant
Three dimensional transducer
Patent number
8,844,366
Issue date
Sep 30, 2014
Hysitron, Inc.
Oden Lee Warren
G01 - MEASURING TESTING
Information
Patent Grant
Nanomechanical testing system
Patent number
8,770,036
Issue date
Jul 8, 2014
Hysitron, Inc.
David James Vodnick
G01 - MEASURING TESTING
Information
Patent Grant
Digital damping control of nanomechanical test instruments
Patent number
8,738,315
Issue date
May 27, 2014
Hysitron Incorporated
Yunje Oh
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Actuatable capacitive transducer for quantitative nanoindentation c...
Patent number
8,453,498
Issue date
Jun 4, 2013
Hysitron, Inc.
Oden L. Warren
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Micromachined comb drive for quantitative nanoindentation
Patent number
8,161,803
Issue date
Apr 24, 2012
Hysitron Incorporated
Yunje Oh
G01 - MEASURING TESTING
Information
Patent Grant
Actuatable capacitive transducer for quantitative nanoindentation c...
Patent number
7,798,011
Issue date
Sep 21, 2010
Hysitron, Inc.
Oden L. Warren
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Patents Applications
last 30 patents
Information
Patent Application
MICRO ELECTRO-MECHANICAL HEATER
Publication number
20160123859
Publication date
May 5, 2016
HYSITRON, INC.
Yunje Oh
G01 - MEASURING TESTING
Information
Patent Application
HIGH TEMPERATURE HEATING SYSTEM
Publication number
20150033835
Publication date
Feb 5, 2015
HYSITRON, INC.
Syed Amanulla Syed Asif
G01 - MEASURING TESTING
Information
Patent Application
NANOMECHANICAL TESTING SYSTEM
Publication number
20140293293
Publication date
Oct 2, 2014
HYSITRON, INC.
David James Vodnick
G01 - MEASURING TESTING
Information
Patent Application
THREE DIMENSIONAL TRANSDUCER
Publication number
20140150562
Publication date
Jun 5, 2014
HYSITRON, INC.
Oden Lee Warren
G01 - MEASURING TESTING
Information
Patent Application
NANOMECHANICAL TESTING SYSTEM
Publication number
20130319127
Publication date
Dec 5, 2013
HYSITRON, INC.
David James Vodnick
G01 - MEASURING TESTING
Information
Patent Application
NANOMECHANICAL TESTING SYSTEM
Publication number
20130319071
Publication date
Dec 5, 2013
HYSITRON, INC.
David James Vodnick
G01 - MEASURING TESTING
Information
Patent Application
MICROELECTROMECHANICAL TRANSDUCER AND TEST SYSTEM
Publication number
20130098144
Publication date
Apr 25, 2013
HYSITRON INCORPORATED
Yunje Oh
G01 - MEASURING TESTING
Information
Patent Application
MICRO ELECTRO-MECHANICAL HEATER
Publication number
20120292528
Publication date
Nov 22, 2012
HYSITRON, INC.
Yunje Oh
G01 - MEASURING TESTING
Information
Patent Application
MICROMACHINED COMB DRIVE FOR QUANTITATIVE NANOINDENTATION
Publication number
20120266666
Publication date
Oct 25, 2012
Hysitron Incorporated
Yunje Oh
G01 - MEASURING TESTING
Information
Patent Application
2-D MEMS TRIBOMETER WITH COMB DRIVES
Publication number
20110265559
Publication date
Nov 3, 2011
Hysitron Incorporated
Yunje Oh
G01 - MEASURING TESTING
Information
Patent Application
ACTUATABLE CAPACITIVE TRANSDUCER FOR QUANTITATIVE NANOINDENTATION C...
Publication number
20110005306
Publication date
Jan 13, 2011
Hysitron Incorporated
Oden L. Warren
G01 - MEASURING TESTING
Information
Patent Application
MICROMACHINED COMB DRIVE FOR QUANTITATIVE NANOINDENTATION
Publication number
20100132441
Publication date
Jun 3, 2010
Hysitron Incorporated
Yunje Oh
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL DAMPING CONTROL OF NANOMECHANICAL TEST INSTRUMENTS
Publication number
20100036636
Publication date
Feb 11, 2010
Hysitron Incorporated
Yunje Oh
G01 - MEASURING TESTING
Information
Patent Application
ACTUATABLE CAPACITIVE TRANSDUCER FOR QUANTITATIVE NANOINDENTATION C...
Publication number
20070180924
Publication date
Aug 9, 2007
Oden L. Warren
G01 - MEASURING TESTING