Ofer ADAN

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Method, computer program product and system for detecting manufactu...
- Patent number 10,957,567
- Issue date Mar 23, 2021
- Applied Materials Israel Ltd.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 10,354,376
- Issue date Jul 16, 2019
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for moving a substrate
- Patent number 10,049,904
- Issue date Aug 14, 2018
- Applied Materials, Inc.
- Ofer Adan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 9,916,652
- Issue date Mar 13, 2018
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Evaluation system and a method for evaluating a substrate
- Patent number 9,835,563
- Issue date Dec 5, 2017
- Applied Materials Israel Ltd.
- Yoram Uziel
- G01 - MEASURING TESTING
Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 9,530,199
- Issue date Dec 27, 2016
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computed readable medium for evaluating a parame...
- Patent number 9,383,196
- Issue date Jul 5, 2016
- Applied Materials Israel Ltd.
- Yuval Yahav
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting a sample using landing lens
- Patent number 9,297,692
- Issue date Mar 29, 2016
- Applied Materials Israel, Ltd.
- Yoram Uziel
- G01 - MEASURING TESTING
Information Patent Grant
High electron energy based overlay error measurement methods and sy...
- Patent number 9,046,475
- Issue date Jun 2, 2015
- Applied Materials Israel, Ltd.
- Moshe Langer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PREDICTION OF ELECTRICAL PROPERTIES OF A SEMICONDUCTOR SPECIMEN
- Publication number 20220210525
- Publication date Jun 30, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Ofer ADAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, COMPUTER PROGRAM PRODUCT AND SYSTEM FOR DETECTING MANUFACTU...
- Publication number 20200118855
- Publication date Apr 16, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Moshe Amzaleg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20180268539
- Publication date Sep 20, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20170243343
- Publication date Aug 24, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20170018066
- Publication date Jan 19, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVALUATION SYSTEM AND A METHOD FOR EVALUATING A SUBSTRATE
- Publication number 20160077016
- Publication date Mar 17, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Yoram Uziel
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING A SAMPLE USING LANDING LENS
- Publication number 20140231632
- Publication date Aug 21, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Yoram Uziel
- G02 - OPTICS
Information Patent Application
SYSTEM, METHOD AND COMPUTED READABLE MEDIUM FOR EVALUATING A PARAME...
- Publication number 20140098211
- Publication date Apr 10, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Yuval Yahav
- G01 - MEASURING TESTING
Information Patent Application
HIGH ELECTRON ENERGY BASED OVERLAY ERROR MEASUREMENT METHODS AND SY...
- Publication number 20120292502
- Publication date Nov 22, 2012
- Moshe Langer
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Method, computer program product and system for detecting manufactu...

Technique for measuring overlay between layers of a multilayer stru...

Method and system for moving a substrate

Technique for measuring overlay between layers of a multilayer stru...

Evaluation system and a method for evaluating a substrate

Technique for measuring overlay between layers of a multilayer stru...

System, method and computed readable medium for evaluating a parame...

System and method for inspecting a sample using landing lens

High electron energy based overlay error measurement methods and sy...

Patents Applicationslast 30 patents

PREDICTION OF ELECTRICAL PROPERTIES OF A SEMICONDUCTOR SPECIMEN

METHOD, COMPUTER PROGRAM PRODUCT AND SYSTEM FOR DETECTING MANUFACTU...

TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...

TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...

TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...

EVALUATION SYSTEM AND A METHOD FOR EVALUATING A SUBSTRATE

SYSTEM AND METHOD FOR INSPECTING A SAMPLE USING LANDING LENS

SYSTEM, METHOD AND COMPUTED READABLE MEDIUM FOR EVALUATING A PARAME...

HIGH ELECTRON ENERGY BASED OVERLAY ERROR MEASUREMENT METHODS AND SY...