Ofer Bokobza

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Grouping systematic defects with feedback from electrical inspection
- Patent number 7,760,929
- Issue date Jul 20, 2010
- Applied Materials, Inc.
- Jacob J. Orbon
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Design-based method for grouping systematic defects in lithography...
- Patent number 7,760,347
- Issue date Jul 20, 2010
- Applied Materials, Inc.
- Youval Nehmadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Design-based monitoring
- Patent number 7,135,344
- Issue date Nov 14, 2006
- Applied Materials, Israel, Ltd.
- Youval Nehmadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
DESIGN-BASED MONITORING
- Publication number 20090007030
- Publication date Jan 1, 2009
- Youval Nehmadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
GROUPING SYSTEMATIC DEFECTS WITH FEEDBACK FROM ELECTRICAL INSPECTION
- Publication number 20070052963
- Publication date Mar 8, 2007
- JACOB J. ORBON
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DESIGN-BASED METHOD FOR GROUPING SYSTEMATIC DEFECTS IN LITHOGRAPHY...
- Publication number 20060269120
- Publication date Nov 30, 2006
- YOUVAL NEHMADI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Design-based monitoring
- Publication number 20050010890
- Publication date Jan 13, 2005
- Applied Materials Israel Ltd.
- Youval Nehmadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY