Ofer Du-Nour

Person

Yokne'am, IL

People

Patents Grantslast 30 patents

Information Patent Grant
High sensitivity real-time bacterial monitor
- Patent number 10,656,085
- Issue date May 19, 2020
- BACTUSENSE TECHNOLOGIES LTD.
- Ofer Du-Nour
- G02 - OPTICS
Information Patent Grant
Method and apparatus for measuring thickness and optical properties...
- Patent number 7,492,467
- Issue date Feb 17, 2009
- Nanometrics Incorporated
- Ofer Du-Nour
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for process control with in-die metrology
- Patent number 7,469,164
- Issue date Dec 23, 2008
- Nanometrics Incorporated
- Ofer Du-Nour
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for thickness decomposition of complicated lay...
- Patent number 6,885,467
- Issue date Apr 26, 2005
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring lateral variations in thickness...
- Patent number 6,801,321
- Issue date Oct 5, 2004
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for production line screening
- Patent number 6,762,838
- Issue date Jul 13, 2004
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring stress in semiconductor wafers
- Patent number 6,678,055
- Issue date Jan 13, 2004
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH SENSITIVITY REAL-TIME BACTERIAL MONITOR
- Publication number 20180100798
- Publication date Apr 12, 2018
- BACTUSENSE TECHNOLOGIES LTD.
- OFER DU-NOUR
- G02 - OPTICS
Information Patent Application
Method and apparatus for process control with in-die metrology
- Publication number 20070298522
- Publication date Dec 27, 2007
- Tevet PCT Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for thickness decomposition of complicated lay...
- Publication number 20040080761
- Publication date Apr 29, 2004
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring stress in semiconductor wafers
- Publication number 20030098704
- Publication date May 29, 2003
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for production line screening
- Publication number 20030002032
- Publication date Jan 2, 2003
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING

Ofer Du-Nour

Person

Patents Grantslast 30 patents

High sensitivity real-time bacterial monitor

Method and apparatus for measuring thickness and optical properties...

Method and apparatus for process control with in-die metrology

Method and apparatus for thickness decomposition of complicated lay...

Method and apparatus for measuring lateral variations in thickness...

Method and apparatus for production line screening

Method and apparatus for measuring stress in semiconductor wafers

Patents Applicationslast 30 patents

HIGH SENSITIVITY REAL-TIME BACTERIAL MONITOR

Method and apparatus for process control with in-die metrology

Method and apparatus for thickness decomposition of complicated lay...

Method and apparatus for measuring stress in semiconductor wafers

Method and apparatus for production line screening