Ofer Shneyour

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Hod-Hasharon, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method for evaluating a region of an object
- Patent number 10,811,219
- Issue date Oct 20, 2020
- Applied Materials Israel Ltd.
- Ofer Shneyour
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluation system and a method for evaluating a substrate
- Patent number 9,835,563
- Issue date Dec 5, 2017
- Applied Materials Israel Ltd.
- Yoram Uziel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EVALUATING A REGION OF AN OBJECT
- Publication number 20200051777
- Publication date Feb 13, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Ofer Shneyour
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATION SYSTEM AND A METHOD FOR EVALUATING A SUBSTRATE
- Publication number 20160077016
- Publication date Mar 17, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Yoram Uziel
- G01 - MEASURING TESTING