Ofer Zaharan

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Jerusalem, IL

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Patents Grantslast 30 patents

Information Patent Grant
Decreasing inaccuracy due to non-periodic effects on scatterometric...
- Patent number 9,851,300
- Issue date Dec 26, 2017
- KLA-Tencor Corporation
- Barak Bringoltz
- G01 - MEASURING TESTING
Information Patent Grant
Overlay metrology by pupil phase analysis
- Patent number 8,582,114
- Issue date Nov 12, 2013
- KLA-Tencor Corporation
- Amnon Manassen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF ANALYZING AND UTILIZING LANDSCAPES TO REDUCE OR ELIMINAT...
- Publication number 20160313658
- Publication date Oct 27, 2016
- KLA-Tencor Corporation
- Tal Marciano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OVERLAY METROLOGY BY PUPIL PHASE ANALYSIS
- Publication number 20130044331
- Publication date Feb 21, 2013
- KLA-Tencor Corporation
- Amnon Manassen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY