Ofir Greenberg

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Haniel, IL

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Patents Grantslast 30 patents

Information Patent Grant
Review of suspected defects using one or more reference dies
- Patent number 9,673,022
- Issue date Jun 6, 2017
- Applied Materials Israel Ltd.
- Ofir Greenberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for scanning an object
- Patent number 9,490,101
- Issue date Nov 8, 2016
- Applied Materials Israel Ltd.
- Yuval Gronau
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
REVIEW OF SUSPECTED DEFECTS USING ONE OR MORE REFERENCE DIES
- Publication number 20170018398
- Publication date Jan 19, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Ofir Greenberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SCANNING AN OBJECT
- Publication number 20160276127
- Publication date Sep 22, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Yuval Gronau
- H01 - BASIC ELECTRIC ELEMENTS