Ohad Bachar

Person

Timrat, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for improved metrology for semiconductor device...
- Patent number 12,131,959
- Issue date Oct 29, 2024
- KLA Corporation
- Liran Yerushalmi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for metrology with layer-specific illumination...
- Patent number 11,852,590
- Issue date Dec 26, 2023
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system and method for measuring diagonal diffraction-base...
- Patent number 11,353,321
- Issue date Jun 7, 2022
- KLA Corporation
- Roie Volkovich
- G01 - MEASURING TESTING
Information Patent Grant
Spectral filter for high-power fiber illumination sources
- Patent number 11,187,838
- Issue date Nov 30, 2021
- KLA Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Grant
High-brightness illumination source for optical metrology
- Patent number 11,156,846
- Issue date Oct 26, 2021
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Nano-structured non-polarizing beamsplitter
- Patent number 10,976,562
- Issue date Apr 13, 2021
- KLA Corporation
- Dmitry Gorelik
- G02 - OPTICS
Information Patent Grant
Method of analyzing and utilizing landscapes to reduce or eliminate...
- Patent number 10,831,108
- Issue date Nov 10, 2020
- KLA Corporation
- Tal Marciano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Localized telecentricity and focus optimization for overlay metrology
- Patent number 10,677,588
- Issue date Jun 9, 2020
- KLA-Tencor Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Scanning in angle-resolved reflectometry and algorithmically elimin...
- Patent number 10,533,940
- Issue date Jan 14, 2020
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for metrology with layer-specific illumination...
- Patent number 10,444,161
- Issue date Oct 15, 2019
- KLA-Tencor Corporation
- Amnon Manassen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for spectral tuning of broadband light sources
- Patent number 10,422,508
- Issue date Sep 24, 2019
- KLA-Tencor Corporation
- Andrew V. Hill
- F21 - LIGHTING
Information Patent Grant
System and method for generating multi-channel tunable illumination...
- Patent number 10,371,626
- Issue date Aug 6, 2019
- KLA-Tencor Corporation
- Andrew V. Hill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems for providing illumination in optical metrology
- Patent number 10,203,247
- Issue date Feb 12, 2019
- KLA-Tencor Corporation
- Gregory R. Brady
- F21 - LIGHTING
Information Patent Grant
Scanning in angle-resolved reflectometry and algorithmically elimin...
- Patent number 10,126,238
- Issue date Nov 13, 2018
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Scanning in angle-resolved reflectometry and algorithmically elimin...
- Patent number 9,958,385
- Issue date May 1, 2018
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Spectral control system
- Patent number 9,921,050
- Issue date Mar 20, 2018
- KLA-Tencor Corporation
- Amnon Manassen
- G02 - OPTICS
Information Patent Grant
Apodization for pupil imaging scatterometry
- Patent number 9,784,987
- Issue date Oct 10, 2017
- KLA-Tencor Corporation
- Andrew V. Hill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Phase characterization of targets
- Patent number 9,581,430
- Issue date Feb 28, 2017
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Systems for providing illumination in optical metrology
- Patent number 9,512,985
- Issue date Dec 6, 2016
- KLA-Tencor Corporation
- Gregory R. Brady
- G02 - OPTICS
Information Patent Grant
Spectral control system
- Patent number 9,341,769
- Issue date May 17, 2016
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Optics symmetrization for metrology
- Patent number 9,164,397
- Issue date Oct 20, 2015
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Apodization for pupil imaging scatterometry
- Patent number 9,091,650
- Issue date Jul 28, 2015
- KLA-Tencor Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Metrology systems and methods
- Patent number 9,080,971
- Issue date Jul 14, 2015
- KLA-Tencor Corp.
- Daniel Kandel
- G01 - MEASURING TESTING
Information Patent Grant
Metrology systems and methods
- Patent number 8,873,054
- Issue date Oct 28, 2014
- KLA-Tencor Corp.
- Daniel Kandel
- G01 - MEASURING TESTING
Information Patent Grant
Overlay metrology by pupil phase analysis
- Patent number 8,582,114
- Issue date Nov 12, 2013
- KLA-Tencor Corporation
- Amnon Manassen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology systems and methods
- Patent number 8,441,639
- Issue date May 14, 2013
- KLA-Tencor Corp.
- Daniel Kandel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR ACQUIRING ALIGNMENT MEASUREMENTS OF STRUCTURE...
- Publication number 20240093985
- Publication date Mar 21, 2024
- KLA Corporation
- Nimrod Shuall
- G01 - MEASURING TESTING
Information Patent Application
EXTRA TALL TARGET METROLOGY
- Publication number 20230324809
- Publication date Oct 12, 2023
- Yoram Uziel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEMS AND METHODS FOR IMPROVED METROLOGY FOR SEMICONDUCTOR DEVICE...
- Publication number 20220344218
- Publication date Oct 27, 2022
- KLA Corporation
- Liran Yerushalmi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Metrology System and Method for Measuring Diagonal Diffraction-Base...
- Publication number 20210389125
- Publication date Dec 16, 2021
- KLA Corporation
- Roie Volkovich
- G01 - MEASURING TESTING
Information Patent Application
High-Brightness Illumination Source for Optical Metrology
- Publication number 20200333612
- Publication date Oct 22, 2020
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
Localized Telecentricity and Focus Optimization for Overlay Metrology
- Publication number 20190310080
- Publication date Oct 10, 2019
- KLA-Tencor Corporation
- Andrew V. Hill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Nano-Structured Non-Polarizing Beamsplitter
- Publication number 20190107727
- Publication date Apr 11, 2019
- KLA-Tencor Corporation
- Dmitry Gorelik
- G02 - OPTICS
Information Patent Application
Scanning in Angle-Resolved Reflectometry and Algorithmically Elimin...
- Publication number 20190094142
- Publication date Mar 28, 2019
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
Spectral Filter for High-Power Fiber Illumination Sources
- Publication number 20190033501
- Publication date Jan 31, 2019
- KLA-Tencor Corporation
- Andrew V. Hill
- G02 - OPTICS
Information Patent Application
Systems and Methods for Metrology with Layer-Specific Illumination...
- Publication number 20180292326
- Publication date Oct 11, 2018
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
SCANNING IN ANGLE-RESOLVED REFLECTOMETRY AND ALGORITHMICALLY ELIMIN...
- Publication number 20180106723
- Publication date Apr 19, 2018
- KLA-Tencor Corporation
- Amnon MANASSEN
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Generating Multi-Channel Tunable Illumination...
- Publication number 20180052099
- Publication date Feb 22, 2018
- KLA-Tencor Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Spectral Tuning of Broadband Light Sources
- Publication number 20170350575
- Publication date Dec 7, 2017
- KLA-Tencor Corporation
- Andrew V. Hill
- G02 - OPTICS
Information Patent Application
Systems for Providing Illumination in Optical Metrology
- Publication number 20170146399
- Publication date May 25, 2017
- KLA-Tencor Corporation
- Gregory R. Brady
- G02 - OPTICS
Information Patent Application
METHODS OF ANALYZING AND UTILIZING LANDSCAPES TO REDUCE OR ELIMINAT...
- Publication number 20160313658
- Publication date Oct 27, 2016
- KLA-Tencor Corporation
- Tal Marciano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Spectral Control System
- Publication number 20160305766
- Publication date Oct 20, 2016
- KLA-Tencor Corporation
- Amnon Manassen
- G02 - OPTICS
Information Patent Application
Apodization for Pupil Imaging Scatterometry
- Publication number 20150316783
- Publication date Nov 5, 2015
- KLA-Tencor Corporation
- Andrew V. Hill
- G02 - OPTICS
Information Patent Application
SCANNING IN ANGLE-RESOLVED REFLECTOMETRY AND ALGORITHMICALLY ELIMIN...
- Publication number 20150116717
- Publication date Apr 30, 2015
- KLA-Tencor Corporation
- Amnon MANASSEN
- G01 - MEASURING TESTING
Information Patent Application
Metrology Systems and Methods
- Publication number 20150036142
- Publication date Feb 5, 2015
- KLA-Tencor Corporation
- Daniel Kandel
- G01 - MEASURING TESTING
Information Patent Application
Systems for Providing Illumination in Optical Metrology
- Publication number 20140240951
- Publication date Aug 28, 2014
- KLA-Tencor Corporation
- Gregory R. Brady
- G02 - OPTICS
Information Patent Application
Spectral Control System
- Publication number 20140168650
- Publication date Jun 19, 2014
- Amnon Manassen
- G02 - OPTICS
Information Patent Application
Apodization for Pupil Imaging Scatterometry
- Publication number 20140146322
- Publication date May 29, 2014
- Andrew V. Hill
- G02 - OPTICS
Information Patent Application
PHASE CHARACTERIZATION OF TARGETS
- Publication number 20140111791
- Publication date Apr 24, 2014
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
Metrology Systems and Methods
- Publication number 20130229661
- Publication date Sep 5, 2013
- KLA-Tencor Corporation
- Daniel Kandel
- G01 - MEASURING TESTING
Information Patent Application
OVERLAY METROLOGY BY PUPIL PHASE ANALYSIS
- Publication number 20130044331
- Publication date Feb 21, 2013
- KLA-Tencor Corporation
- Amnon Manassen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICS SYMMETRIZATION FOR METROLOGY
- Publication number 20120033226
- Publication date Feb 9, 2012
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEMS AND METHODS
- Publication number 20110069312
- Publication date Mar 24, 2011
- KLA-Tencor Corporation
- Daniel Kandel
- G01 - MEASURING TESTING

Ohad Bachar

Person

Patents Grantslast 30 patents

Systems and methods for improved metrology for semiconductor device...

Systems and methods for metrology with layer-specific illumination...

Metrology system and method for measuring diagonal diffraction-base...

Spectral filter for high-power fiber illumination sources

High-brightness illumination source for optical metrology

Nano-structured non-polarizing beamsplitter

Method of analyzing and utilizing landscapes to reduce or eliminate...

Localized telecentricity and focus optimization for overlay metrology

Scanning in angle-resolved reflectometry and algorithmically elimin...

Systems and methods for metrology with layer-specific illumination...

System and method for spectral tuning of broadband light sources

System and method for generating multi-channel tunable illumination...

Systems for providing illumination in optical metrology

Scanning in angle-resolved reflectometry and algorithmically elimin...

Scanning in angle-resolved reflectometry and algorithmically elimin...

Spectral control system

Apodization for pupil imaging scatterometry

Phase characterization of targets

Systems for providing illumination in optical metrology

Spectral control system

Optics symmetrization for metrology

Apodization for pupil imaging scatterometry

Metrology systems and methods

Metrology systems and methods

Overlay metrology by pupil phase analysis

Metrology systems and methods

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR ACQUIRING ALIGNMENT MEASUREMENTS OF STRUCTURE...

EXTRA TALL TARGET METROLOGY

SYSTEMS AND METHODS FOR IMPROVED METROLOGY FOR SEMICONDUCTOR DEVICE...

Metrology System and Method for Measuring Diagonal Diffraction-Base...

High-Brightness Illumination Source for Optical Metrology

Localized Telecentricity and Focus Optimization for Overlay Metrology

Nano-Structured Non-Polarizing Beamsplitter

Scanning in Angle-Resolved Reflectometry and Algorithmically Elimin...

Spectral Filter for High-Power Fiber Illumination Sources

Systems and Methods for Metrology with Layer-Specific Illumination...

SCANNING IN ANGLE-RESOLVED REFLECTOMETRY AND ALGORITHMICALLY ELIMIN...

System and Method for Generating Multi-Channel Tunable Illumination...

System and Method for Spectral Tuning of Broadband Light Sources

Systems for Providing Illumination in Optical Metrology

METHODS OF ANALYZING AND UTILIZING LANDSCAPES TO REDUCE OR ELIMINAT...

Spectral Control System

Apodization for Pupil Imaging Scatterometry

SCANNING IN ANGLE-RESOLVED REFLECTOMETRY AND ALGORITHMICALLY ELIMIN...

Metrology Systems and Methods

Systems for Providing Illumination in Optical Metrology

Spectral Control System

Apodization for Pupil Imaging Scatterometry

PHASE CHARACTERIZATION OF TARGETS

Metrology Systems and Methods

OVERLAY METROLOGY BY PUPIL PHASE ANALYSIS

OPTICS SYMMETRIZATION FOR METROLOGY

METROLOGY SYSTEMS AND METHODS