Ohad SHAUBI

Person

Yavne, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Machine learning-based classification of defects in a semiconductor...
- Patent number 12,361,531
- Issue date Jul 15, 2025
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive positioning of drones for enhanced face recognition
- Patent number 11,755,984
- Issue date Sep 12, 2023
- Anyvision Interactive Technologies Ltd.
- Ishay Sivan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,568,531
- Issue date Jan 31, 2023
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating a training set usable for examination of a semiconductor...
- Patent number 11,199,506
- Issue date Dec 14, 2021
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of classifying defects in a semiconductor specimen and syste...
- Patent number 11,037,286
- Issue date Jun 15, 2021
- Applied Materials Israel Ltd.
- Assaf Asbag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of generating a training set usable for examination of a sem...
- Patent number 10,832,092
- Issue date Nov 10, 2020
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for generating a traini...
- Patent number 10,803,575
- Issue date Oct 13, 2020
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G05 - CONTROLLING REGULATING
Information Patent Grant
System, method and computer program product for generating a traini...
- Patent number 10,360,669
- Issue date Jul 23, 2019
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING-BASED CLASSIFICATION OF DEFECTS IN A SEMICONDUCTOR...
- Publication number 20220222806
- Publication date Jul 14, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE POSITIONING OF DRONES FOR ENHANCED FACE RECOGNITION
- Publication number 20210034843
- Publication date Feb 4, 2021
- Anyvision Interactive Technologies Ltd.
- Ishay SIVAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...
- Publication number 20200294224
- Publication date Sep 17, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method Of Generating A Training Set Usable For Examination Of A Sem...
- Publication number 20200226420
- Publication date Jul 16, 2020
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR GENERATING A TRAINI...
- Publication number 20190347785
- Publication date Nov 14, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING A TRAINING SET USABLE FOR EXAMINATION OF A SEMICONDUCTOR...
- Publication number 20190257767
- Publication date Aug 22, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF CLASSIFYING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTE...
- Publication number 20190096053
- Publication date Mar 28, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Assaf ASBAG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR GENERATING A TRAINI...
- Publication number 20190066290
- Publication date Feb 28, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING

Ohad SHAUBI

Person

Patents Grantslast 30 patents

Machine learning-based classification of defects in a semiconductor...

Adaptive positioning of drones for enhanced face recognition

Method of deep learning-based examination of a semiconductor specim...

Generating a training set usable for examination of a semiconductor...

Method of classifying defects in a semiconductor specimen and syste...

Method of generating a training set usable for examination of a sem...

System, method and computer program product for generating a traini...

System, method and computer program product for generating a traini...

Patents Applicationslast 30 patents

MACHINE LEARNING-BASED CLASSIFICATION OF DEFECTS IN A SEMICONDUCTOR...

ADAPTIVE POSITIONING OF DRONES FOR ENHANCED FACE RECOGNITION

METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...

Method Of Generating A Training Set Usable For Examination Of A Sem...

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR GENERATING A TRAINI...

GENERATING A TRAINING SET USABLE FOR EXAMINATION OF A SEMICONDUCTOR...

METHOD OF CLASSIFYING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTE...

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR GENERATING A TRAINI...