Oksen Baris

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San Francisco, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Inspection for multiple process steps in a single inspection process
- Patent number 10,712,289
- Issue date Jul 14, 2020
- KLA-Tencor Corp.
- Oksen Toros Baris
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for iterative defect classification
- Patent number 9,922,269
- Issue date Mar 20, 2018
- KLA-Tencor Corporation
- Sankar Venkataraman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer defect discovery
- Patent number 9,518,934
- Issue date Dec 13, 2016
- KLA-Tencor Corp.
- Hong Chen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Wafer Defect Discovery
- Publication number 20170076911
- Publication date Mar 16, 2017
- KLA-Tencor Corporation
- Hong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Iterative Defect Classification
- Publication number 20160358041
- Publication date Dec 8, 2016
- KLA-Tencor Corporation
- Sankar Venkataraman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer Defect Discovery
- Publication number 20160123898
- Publication date May 5, 2016
- KLA-Tencor Corporation
- Hong Chen
- G01 - MEASURING TESTING
Information Patent Application
Inspection for Multiple Process Steps in a Single Inspection Process
- Publication number 20160033420
- Publication date Feb 4, 2016
- KLA-Tencor Corporation
- Oksen Toros Baris
- G01 - MEASURING TESTING