Olaf Sünwoldt

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Berlin, DE

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Patents Grantslast 30 patents

Information Patent Grant
Device for receiving a test sample
- Patent number 8,506,909
- Issue date Aug 13, 2013
- JPK Instruments AG
- Olaf Sünwoldt
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 7,473,894
- Issue date Jan 6, 2009
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Probe mounting device for a scanning probe microscope
- Patent number 7,114,405
- Issue date Oct 3, 2006
- JPK Instruments AG
- Olaf Sünwoldt
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 7,022,985
- Issue date Apr 4, 2006
- JPK Instruments AG
- Detlef Knebel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Device for Receiving a Test Sample
- Publication number 20080163702
- Publication date Jul 10, 2008
- Olaf Sunwoldt
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for a scanning probe microscope
- Publication number 20060168703
- Publication date Jul 27, 2006
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for a scanning probe microscope
- Publication number 20050061970
- Publication date Mar 24, 2005
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
Device for fixing a measuring probe for a raster scanning probe mic...
- Publication number 20050017150
- Publication date Jan 27, 2005
- Olaf Sunwoldt
- G01 - MEASURING TESTING