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Ole HANSEN
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Hoersholm, DK
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Patents Grants
last 30 patents
Information
Patent Grant
Atomic layer process printer
Patent number
12,049,700
Issue date
Jul 30, 2024
ATLANT 3D Nanosystems ApS
Maksym Plakhotnyuk
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Measuring temperature-modulated properties of a test sample
Patent number
11,740,279
Issue date
Aug 29, 2023
KLA Corporation
Dirch Hjorth Petersen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe for testing an electrical property of a test sample
Patent number
11,693,028
Issue date
Jul 4, 2023
KLA Corporation
Frederik Westergaard Østerberg
G01 - MEASURING TESTING
Information
Patent Grant
Position correction method and a system for position correction in...
Patent number
11,131,700
Issue date
Sep 28, 2021
CAPRES A/S
Frederik Westergaard Osterberg
G01 - MEASURING TESTING
Information
Patent Grant
Device for extracting volatile species from a liquid
Patent number
10,930,486
Issue date
Feb 23, 2021
Danmarks Tekniske Universitet
Daniel Bøndergaard Trimarco
G01 - MEASURING TESTING
Information
Patent Grant
Nanostructured silicon based solar cells and methods to produce nan...
Patent number
9,705,017
Issue date
Jul 11, 2017
Danmarks Tekniske Universitet
Rasmus Schmidt Davidsen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
All-optical pressure sensor
Patent number
9,658,123
Issue date
May 23, 2017
Technical University of Denmark
Kasper Reck
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Single-position hall effect measurements
Patent number
9,644,939
Issue date
May 9, 2017
Capres A/S
Fei Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MEMS optical sensor
Patent number
9,574,956
Issue date
Feb 21, 2017
Technical University of Denmark
Kasper Reck
G02 - OPTICS
Information
Patent Grant
Wavelength sweepable laser source
Patent number
9,337,618
Issue date
May 10, 2016
Danmarks Tekniske Universitet
Kresten Yvind
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method of determining an electrical property of a test sample
Patent number
8,907,690
Issue date
Dec 9, 2014
Capres A/S
Dirch H. Petersen
G01 - MEASURING TESTING
Information
Patent Grant
Flexible nano-imprint stamp
Patent number
8,075,298
Issue date
Dec 13, 2011
Nil Technology APS
Theodor Nielsen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
ATOMIC LAYER PROCESS PRINTER
Publication number
20220307133
Publication date
Sep 29, 2022
Maksym Plakhotnyuk
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Micro-Four-Point Metrology of Joule-Heating-Induced Modulation of T...
Publication number
20210333228
Publication date
Oct 28, 2021
KLA Corporation
Dirch Hjorth Petersen
G01 - MEASURING TESTING
Information
Patent Application
Measuring Temperature-Modulated Properties of a Test Sample
Publication number
20210333316
Publication date
Oct 28, 2021
KLA Corporation
Dirch Hjorth Petersen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROBE FOR TESTING AN ELECTRICAL PROPERTY OF A TEST SAMPLE
Publication number
20200278380
Publication date
Sep 3, 2020
Frederik Westergaard Østerberg
G01 - MEASURING TESTING
Information
Patent Application
A POSITION CORRECTION METHOD AND A SYSTEM FOR POSITION CORRECTION I...
Publication number
20190310295
Publication date
Oct 10, 2019
CAPRES A/S
Frederik Westergaard Osterberg
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR EXTRACTING VOLATILE SPECIES FROM A LIQUID
Publication number
20170338090
Publication date
Nov 23, 2017
Daniel Bøndergaard Trimarco
G01 - MEASURING TESTING
Information
Patent Application
NANOSTRUCTURED SILICON BASED SOLAR CELLS AND METHODS TO PRODUCE NAN...
Publication number
20160240703
Publication date
Aug 18, 2016
DANMARKS TEKNISKE UNIVERSITET
Rasmus Schmidt Davidsen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
All-Optical Pressure Sensor
Publication number
20160123829
Publication date
May 5, 2016
Technical University of Denmark
Kasper Reck
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE HOLDER FOR ELECTRON MICROSCOPY
Publication number
20150170872
Publication date
Jun 18, 2015
DANMARKS TEKNISKE UNIVERSITET
Filippo CAVALCA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WAVELENGTH SWEEPABLE LASER SOURCE
Publication number
20150171597
Publication date
Jun 18, 2015
DANMARKS TEKNISKE UNIVERSITET
Kresten Yvind
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MEMS Optical Sensor
Publication number
20150131100
Publication date
May 14, 2015
Technical University of Denmark
Kasper Reck
G02 - OPTICS
Information
Patent Application
SINGLE-POSITION HALL EFFECT MEASUREMENTS
Publication number
20140015552
Publication date
Jan 16, 2014
Capres A/S
Fei Wang
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR NANOIMPRINT LITHOGRAPHY
Publication number
20120292820
Publication date
Nov 22, 2012
NIL Technology ApS
Kristian Smistrup
B82 - NANO-TECHNOLOGY
Information
Patent Application
METHOD OF DETERMINING AN ELECTRICAL PROPERTY OF A TEST SAMPLE
Publication number
20100271059
Publication date
Oct 28, 2010
Dirch H. Petersen
G01 - MEASURING TESTING
Information
Patent Application
Flexible Nano-Imprint Stamp
Publication number
20080000375
Publication date
Jan 3, 2008
NIL Technology ApS
Theodor Nielsen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Flexible structure with integrated sensor/actuator
Publication number
20030089182
Publication date
May 15, 2003
Jacob Thaysen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Flexible structure with integrated sensor/actuator
Publication number
20030062193
Publication date
Apr 3, 2003
Jacob Thaysen
B81 - MICRO-STRUCTURAL TECHNOLOGY