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Oleg Mitrofanov
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New York, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Light source orientation detector
Patent number
9,297,878
Issue date
Mar 29, 2016
Alcatel Lucent
Gang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Optically measuring electric field intensities
Patent number
7,872,468
Issue date
Jan 18, 2011
Alcatel-Lucent USA Inc.
Oleg Mitrofanov
G01 - MEASURING TESTING
Information
Patent Grant
Flexible photo-detectors
Patent number
7,847,364
Issue date
Dec 7, 2010
Alcatel-Lucent USA Inc.
Gang Chen
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Near-field terahertz imaging
Patent number
7,608,827
Issue date
Oct 27, 2009
Alcatel-Lucent USA Inc.
Oleg Mitrofanov
G01 - MEASURING TESTING
Information
Patent Grant
Optically measuring electric field intensities
Patent number
7,336,062
Issue date
Feb 26, 2008
Lucent Technologies Inc.
Oleg Mitrofanov
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Optically measuring electric field intensities
Publication number
20100283451
Publication date
Nov 11, 2010
Oleg Mitrofanov
G01 - MEASURING TESTING
Information
Patent Application
FABRICATING APPARATUS WITH DOPED ORGANIC SEMICONDUCTORS
Publication number
20090148979
Publication date
Jun 11, 2009
Alcatel-Lucent USA, Incorporated
Christian Leo Kloc
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Flexible photo-detectors
Publication number
20090014825
Publication date
Jan 15, 2009
Lucent Technologies Inc.
Gang Chen
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
Light source orientation detector
Publication number
20070237473
Publication date
Oct 11, 2007
Lucent Technologies Inc.
Gang Chen
G02 - OPTICS
Information
Patent Application
Fabricating apparatus with doped organic semiconductors
Publication number
20070215863
Publication date
Sep 20, 2007
Lucent Technologies Inc.
Christian Leo Kloc
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Near-field terahertz imaging
Publication number
20070181811
Publication date
Aug 9, 2007
Oleg Mitrofanov
G01 - MEASURING TESTING
Information
Patent Application
Optically measuring electric field intensities
Publication number
20060098695
Publication date
May 11, 2006
Oleg Mitrofanov
G01 - MEASURING TESTING