Oleksiy Lopatin

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Scarborough, CA

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for high-throughput inspection of large flat p...
- Patent number 7,180,084
- Issue date Feb 20, 2007
- Photon Dynamics, Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for high-throughput inspection of large flat p...
- Patent number 7,041,998
- Issue date May 9, 2006
- Photon Dynamics, Inc.
- Adam Weiss
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for high-throughput inspection of large flat p...
- Publication number 20060186361
- Publication date Aug 24, 2006
- Photon Dynamics, Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for high-throughput inspection of large flat p...
- Publication number 20040188643
- Publication date Sep 30, 2004
- Photon Dynamics, Inc.
- Adam Weiss
- G01 - MEASURING TESTING