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Oliver BREITWIESER
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Gundelfingen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Test matrix adapter device
Patent number
10,436,817
Issue date
Oct 8, 2019
TDK-MICRONAS GMBH
Timo Kaufmann
G01 - MEASURING TESTING
Information
Patent Grant
Electrical component package with surface leads
Patent number
10,165,686
Issue date
Dec 25, 2018
TDK-MICRONAS GMBH
Joerg Franke
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Injection-molded circuit carrier
Patent number
9,718,224
Issue date
Aug 1, 2017
TDK-MICRONAS GMBH
Joerg Franke
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Magnetic field measuring device
Patent number
9,645,203
Issue date
May 9, 2017
Micronas GmbH
Timo Kaufmann
G01 - MEASURING TESTING
Information
Patent Grant
Measuring system
Patent number
9,513,343
Issue date
Dec 6, 2016
Micronas GmbH
Klaus Heberle
G01 - MEASURING TESTING
Information
Patent Grant
Measuring system
Patent number
9,442,169
Issue date
Sep 13, 2016
Micronas GmbH
Klaus Heberle
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEST MATRIX ADAPTER DEVICE
Publication number
20170227578
Publication date
Aug 10, 2017
TDK - Micronas GmbH
Timo KAUFMANN
G01 - MEASURING TESTING
Information
Patent Application
INJECTION-MOLDED CIRCUIT CARRIER
Publication number
20160061634
Publication date
Mar 3, 2016
Micronas GmbH
Joerg FRANKE
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD MEASURING DEVICE
Publication number
20160033587
Publication date
Feb 4, 2016
Micronas GmbH
Timo KAUFMANN
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICAL COMPONENT
Publication number
20160037641
Publication date
Feb 4, 2016
Micronas GmbH
Joerg FRANKE
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
MEASURING SYSTEM
Publication number
20140333298
Publication date
Nov 13, 2014
Micronas GmbH
Klaus HEBERLE
G01 - MEASURING TESTING
Information
Patent Application
MEASURING SYSTEM
Publication number
20140333299
Publication date
Nov 13, 2014
Micronas GmbH
Klaus HEBERLE
G01 - MEASURING TESTING