Oliver Broermann

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Lithographic mask, and method for covering a mask layer
- Patent number 7,405,024
- Issue date Jul 29, 2008
- Infineon Technologies AG
- Uwe Paul Schroeder
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for measuring a characteristic dimension of at least one pat...
- Patent number 6,980,304
- Issue date Dec 27, 2005
- Infineon Technologies, AG
- Oliver Broermann
- G01 - MEASURING TESTING
Information Patent Grant
Measuring configuration and method for measuring a critical dimensi...
- Patent number 6,897,422
- Issue date May 24, 2005
- Infineon Technologies AG
- Oliver Broermann
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Lithographic mask, and method for covering a mask layer
- Publication number 20050106475
- Publication date May 19, 2005
- Uwe Paul Schroeder
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for measuring a characteristic dimension of at least one pat...
- Publication number 20040201858
- Publication date Oct 14, 2004
- Oliver Broermann
- G01 - MEASURING TESTING
Information Patent Application
Measuring configuration and method for measuring a critical dimensi...
- Publication number 20030015674
- Publication date Jan 23, 2003
- Oliver Broermann
- H01 - BASIC ELECTRIC ELEMENTS