Oliver Chyan

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Denton, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for copper etch rate monitoring and control
- Patent number 11,099,131
- Issue date Aug 24, 2021
- University of North Texas
- Oliver Ming-Ren Chyan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Wafer fabrication monitoring/control system and method
- Patent number 9,366,601
- Issue date Jun 14, 2016
- University of North Texas
- Jin-Jian Chen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting impurities in wet chemicals
- Patent number 6,145,372
- Issue date Nov 14, 2000
- Texas Instruments Incorporated
- Lindsey H. Hall
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EXTENDED INFRARED SPECTROSCOPIC WAFER CHARACTERIZATION METROLOGY
- Publication number 20210116390
- Publication date Apr 22, 2021
- University of North Texas
- Jin-Jian Chen
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE SURFACE FINISHING FOR CORROSION INHIBITION VIA CHEMICAL V...
- Publication number 20210071308
- Publication date Mar 11, 2021
- University of North Texas
- Oliver Ming-Ren Chyan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEMS AND METHODS FOR COPPER ETCH RATE MONITORING AND CONTROL
- Publication number 20190323962
- Publication date Oct 24, 2019
- University of North Texas
- Oliver Ming-Ren CHYAN
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...