Oliver D. Patterson

Person

Poughkeepsie, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for and method of net trace prior level subtraction
- Patent number 10,649,026
- Issue date May 12, 2020
- GLOBALFOUNDRIES Inc.
- Oliver D. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage contrast characterization structures and methods for within...
- Patent number 9,519,210
- Issue date Dec 13, 2016
- International Business Machines Corporation
- Oliver D. Patterson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of inspecting a semiconductor substrate
- Patent number 9,390,884
- Issue date Jul 12, 2016
- GLOBALFOUNDRIES Inc.
- Eric C. Harley
- G01 - MEASURING TESTING
Information Patent Grant
Evaluating transistors with e-beam inspection
- Patent number 9,291,665
- Issue date Mar 22, 2016
- GLOBALFOUNDRIES Inc.
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Grant
Voltage contrast inspection of deep trench isolation
- Patent number 9,293,382
- Issue date Mar 22, 2016
- GLOBALFOUNDRIES Inc.
- Norbert Arnold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe-able voltage contrast test structures
- Patent number 9,213,060
- Issue date Dec 15, 2015
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING
Information Patent Grant
Inspection tool and methodology for three dimensional voltage contr...
- Patent number 9,207,279
- Issue date Dec 8, 2015
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Grant
Probe-able voltage contrast test structures
- Patent number 9,103,875
- Issue date Aug 11, 2015
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING
Information Patent Grant
Probe-able voltage contrast test structures
- Patent number 9,097,760
- Issue date Aug 4, 2015
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING
Information Patent Grant
Voltage contrast inspection of deep trench isolation
- Patent number 8,927,989
- Issue date Jan 6, 2015
- International Business Machines Corporation
- Norbert Arnold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection tool and methodology for three dimensional voltage contr...
- Patent number 8,841,933
- Issue date Sep 23, 2014
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Grant
Static random access memory test structure
- Patent number 8,787,074
- Issue date Jul 22, 2014
- International Business Machines Corporation
- Oliver D. Patterson
- G11 - INFORMATION STORAGE
Information Patent Grant
Test structure for detection of gap in conductive layer of multilay...
- Patent number 8,766,259
- Issue date Jul 1, 2014
- International Business Machines Corporation
- Renee T. Mo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Robust inspection alignment of semiconductor inspection tools using...
- Patent number 8,750,597
- Issue date Jun 10, 2014
- International Business Machines Corporation
- Oliver D. Patterson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test structure for detection of gap in conductive layer of multilay...
- Patent number 8,399,266
- Issue date Mar 19, 2013
- International Business Machines Corporation
- Renee T. Mo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe-able voltage contrast test structures
- Patent number 8,350,583
- Issue date Jan 8, 2013
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING
Information Patent Grant
In-line voltage contrast detection of PFET silicide encroachment
- Patent number 8,039,837
- Issue date Oct 18, 2011
- International Business Machines Corporation
- Oliver D. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Varying capacitance voltage contrast structures to determine defect...
- Patent number 7,927,895
- Issue date Apr 19, 2011
- International Business Machines Corporation
- Christian Lavoie
- G01 - MEASURING TESTING
Information Patent Grant
Structure and method of mapping signal intensity to surface voltage...
- Patent number 7,772,866
- Issue date Aug 10, 2010
- International Business Machines Corporation
- Oliver D. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure for resistive open detection using voltage contrast...
- Patent number 7,733,109
- Issue date Jun 8, 2010
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Grant
Grounding front-end-of-line structures on a SOI substrate
- Patent number 7,732,866
- Issue date Jun 8, 2010
- International Business Machines Corporation
- William J. Cote
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated test structures for electron beam inspecti...
- Patent number 7,679,083
- Issue date Mar 16, 2010
- Samsung Electronics Co., Ltd.
- Min Chul Sun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect identification system and method for repairing killer defect...
- Patent number 7,547,560
- Issue date Jun 16, 2009
- Agere Systems Inc.
- Oliver Desmond Patterson
- G01 - MEASURING TESTING
Information Patent Grant
Grounding front-end-of-line structures on a SOI substrate
- Patent number 7,518,190
- Issue date Apr 14, 2009
- International Business Machines Corporation
- William J. Cote
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Buried short location determination using voltage contrast inspection
- Patent number 7,474,107
- Issue date Jan 6, 2009
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Grant
Test structures and method of defect detection using voltage contra...
- Patent number 7,456,636
- Issue date Nov 25, 2008
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and computer program product for optimizing insp...
- Patent number 7,397,556
- Issue date Jul 8, 2008
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Grant
Test structure and method for yield improvement of double poly bipo...
- Patent number 7,074,628
- Issue date Jul 11, 2006
- Agere Systems, INC
- Bradley J. Albers
- G01 - MEASURING TESTING
Information Patent Grant
Alternating pulse dual-beam apparatus, methods and systems for volt...
- Patent number 6,906,538
- Issue date Jun 14, 2005
- Agere Systems, INC
- Oliver Desmond Patterson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANGLED BEAM INSPECTION SYSTEM FOR SEMICONDUCTOR DEVICES
- Publication number 20190113469
- Publication date Apr 18, 2019
- GLOBALFOUNDRIES INC.
- Oliver D. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR AND METHOD OF NET TRACE PRIOR LEVEL SUBTRACTION
- Publication number 20180284184
- Publication date Oct 4, 2018
- GLOBALFOUNDRIES INC.
- OLIVER D. PATTERSON
- G01 - MEASURING TESTING
Information Patent Application
SRAM-LIKE EBI STRUCTURE DESIGN AND IMPLEMENTATION TO CAPTURE MOSFET...
- Publication number 20170154687
- Publication date Jun 1, 2017
- GLOBALFOUNDRIES INC.
- Zhigang Song
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE CONTRAST CHARACTERIZATION STRUCTURES AND METHODS FOR WITHIN...
- Publication number 20160148849
- Publication date May 26, 2016
- International Business Machines Corporation
- Oliver D. Patterson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR INSPECTION SYSTEM INCLUDING REFERENCE IMAGE GENERATOR
- Publication number 20150325406
- Publication date Nov 12, 2015
- International Business Machines Corporation
- Eric C. Harley
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE CONTRAST INSPECTION OF DEEP TRENCH ISOLATION
- Publication number 20150041809
- Publication date Feb 12, 2015
- International Business Machines Corporation
- Norbert Arnold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION TOOL AND METHODOLOGY FOR THREE DIMENSIONAL VOLTAGE CONTR...
- Publication number 20140153815
- Publication date Jun 5, 2014
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE CONTRAST INSPECTION OF DEEP TRENCH ISOLATION
- Publication number 20140145191
- Publication date May 29, 2014
- International Business Machines Corporation
- Norbert Arnold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATING TRANSISTORS WITH E-BEAM INSPECTION
- Publication number 20130300451
- Publication date Nov 14, 2013
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE FOR DETECTION OF GAP IN CONDUCTIVE LAYER OF MULTILAY...
- Publication number 20130140565
- Publication date Jun 6, 2013
- International Business Machines Corporation
- Renee T. Mo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ROBUST INSPECTION ALIGNMENT OF SEMICONDUCTOR INSPECTION TOOLS USING...
- Publication number 20130129189
- Publication date May 23, 2013
- International Business Machines Corporation
- Kevin T. Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STATIC RANDOM ACCESS MEMORY TEST STRUCTURE
- Publication number 20130094315
- Publication date Apr 18, 2013
- International Business Machines Corporation
- Oliver D. Patterson
- G11 - INFORMATION STORAGE
Information Patent Application
PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES
- Publication number 20120319715
- Publication date Dec 20, 2012
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING
Information Patent Application
PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES
- Publication number 20120319714
- Publication date Dec 20, 2012
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING
Information Patent Application
PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES
- Publication number 20120319716
- Publication date Dec 20, 2012
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE FOR DETECTION OF GAP IN CONDUCTIVE LAYER OF MULTILAY...
- Publication number 20120187400
- Publication date Jul 26, 2012
- International Business Machines Corporation
- Renee T. Mo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION TOOL AND METHODOLOGY FOR THREE DIMENSIONAL VOLTAGE CONTR...
- Publication number 20120062269
- Publication date Mar 15, 2012
- International Business Machines Corporation
- Oliver D. Patterson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VARYING CAPACITANCE VOLTAGE CONTRAST STRUCTURES TO DETERMINE DEFECT...
- Publication number 20110080180
- Publication date Apr 7, 2011
- International Business Machines Corporation
- Christian Lavoie
- G01 - MEASURING TESTING
Information Patent Application
PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES
- Publication number 20110037493
- Publication date Feb 17, 2011
- International Business Machines Corporation
- William J. Cote
- G01 - MEASURING TESTING
Information Patent Application
BODY CONTACT STRUCTURE FOR IN-LINE VOLTAGE CONTRAST DETECTION OF PF...
- Publication number 20100301331
- Publication date Dec 2, 2010
- International Business Machines Corporation
- Oliver D. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GROUNDING FRONT-END-OF-LINE STRUCTURES ON A SOI SUBSTRATE
- Publication number 20090146211
- Publication date Jun 11, 2009
- William J. Cote
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE AND METHOD FOR RESISTIVE OPEN DETECTION USING VOLTAG...
- Publication number 20090096461
- Publication date Apr 16, 2009
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Integrated Test Structures For Electron Beam Inspecti...
- Publication number 20080237586
- Publication date Oct 2, 2008
- Min Chul Sun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR OPTIMIZING INSP...
- Publication number 20080225284
- Publication date Sep 18, 2008
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND METHOD OF MAPPING SIGNAL INTENSITY TO SURFACE VOLTAGE...
- Publication number 20080217612
- Publication date Sep 11, 2008
- International Business Machines Corporation
- Oliver D. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR OPTIMIZING INSP...
- Publication number 20080100831
- Publication date May 1, 2008
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURES AND METHOD OF DEFECT DETECTION USING VOLTAGE CONTRA...
- Publication number 20070229092
- Publication date Oct 4, 2007
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Application
BURIED SHORT LOCATION DETERMINATION USING VOLTAGE CONTRAST INSPECTION
- Publication number 20070222470
- Publication date Sep 27, 2007
- International Business Machines Corporation
- Oliver D. Patterson
- G01 - MEASURING TESTING
Information Patent Application
GROUNDING FRONT-END-OF-LINE STRUCTURES ON A SOI SUBSTRATE
- Publication number 20070221990
- Publication date Sep 27, 2007
- International Business Machines Corporation
- William J. Cote
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Defect identification system and method for repairing killer defect...
- Publication number 20070010032
- Publication date Jan 11, 2007
- Oliver Desmond Patterson
- G01 - MEASURING TESTING

Oliver D. Patterson

Person

Patents Grantslast 30 patents

Apparatus for and method of net trace prior level subtraction

Voltage contrast characterization structures and methods for within...

Method of inspecting a semiconductor substrate

Evaluating transistors with e-beam inspection

Voltage contrast inspection of deep trench isolation

Probe-able voltage contrast test structures

Inspection tool and methodology for three dimensional voltage contr...

Probe-able voltage contrast test structures

Probe-able voltage contrast test structures

Voltage contrast inspection of deep trench isolation

Inspection tool and methodology for three dimensional voltage contr...

Static random access memory test structure

Test structure for detection of gap in conductive layer of multilay...

Robust inspection alignment of semiconductor inspection tools using...

Test structure for detection of gap in conductive layer of multilay...

Probe-able voltage contrast test structures

In-line voltage contrast detection of PFET silicide encroachment

Varying capacitance voltage contrast structures to determine defect...

Structure and method of mapping signal intensity to surface voltage...

Test structure for resistive open detection using voltage contrast...

Grounding front-end-of-line structures on a SOI substrate

Semiconductor integrated test structures for electron beam inspecti...

Defect identification system and method for repairing killer defect...

Grounding front-end-of-line structures on a SOI substrate

Buried short location determination using voltage contrast inspection

Test structures and method of defect detection using voltage contra...

Method, apparatus, and computer program product for optimizing insp...

Test structure and method for yield improvement of double poly bipo...

Alternating pulse dual-beam apparatus, methods and systems for volt...

Patents Applicationslast 30 patents

ANGLED BEAM INSPECTION SYSTEM FOR SEMICONDUCTOR DEVICES

APPARATUS FOR AND METHOD OF NET TRACE PRIOR LEVEL SUBTRACTION

SRAM-LIKE EBI STRUCTURE DESIGN AND IMPLEMENTATION TO CAPTURE MOSFET...

VOLTAGE CONTRAST CHARACTERIZATION STRUCTURES AND METHODS FOR WITHIN...

SEMICONDUCTOR INSPECTION SYSTEM INCLUDING REFERENCE IMAGE GENERATOR

VOLTAGE CONTRAST INSPECTION OF DEEP TRENCH ISOLATION

INSPECTION TOOL AND METHODOLOGY FOR THREE DIMENSIONAL VOLTAGE CONTR...

VOLTAGE CONTRAST INSPECTION OF DEEP TRENCH ISOLATION

EVALUATING TRANSISTORS WITH E-BEAM INSPECTION

TEST STRUCTURE FOR DETECTION OF GAP IN CONDUCTIVE LAYER OF MULTILAY...

ROBUST INSPECTION ALIGNMENT OF SEMICONDUCTOR INSPECTION TOOLS USING...

STATIC RANDOM ACCESS MEMORY TEST STRUCTURE

PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES

PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES

PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES

TEST STRUCTURE FOR DETECTION OF GAP IN CONDUCTIVE LAYER OF MULTILAY...

INSPECTION TOOL AND METHODOLOGY FOR THREE DIMENSIONAL VOLTAGE CONTR...

VARYING CAPACITANCE VOLTAGE CONTRAST STRUCTURES TO DETERMINE DEFECT...

PROBE-ABLE VOLTAGE CONTRAST TEST STRUCTURES

BODY CONTACT STRUCTURE FOR IN-LINE VOLTAGE CONTRAST DETECTION OF PF...

GROUNDING FRONT-END-OF-LINE STRUCTURES ON A SOI SUBSTRATE

TEST STRUCTURE AND METHOD FOR RESISTIVE OPEN DETECTION USING VOLTAG...

Semiconductor Integrated Test Structures For Electron Beam Inspecti...

METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR OPTIMIZING INSP...

STRUCTURE AND METHOD OF MAPPING SIGNAL INTENSITY TO SURFACE VOLTAGE...

METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR OPTIMIZING INSP...

TEST STRUCTURES AND METHOD OF DEFECT DETECTION USING VOLTAGE CONTRA...

BURIED SHORT LOCATION DETERMINATION USING VOLTAGE CONTRAST INSPECTION

GROUNDING FRONT-END-OF-LINE STRUCTURES ON A SOI SUBSTRATE

Defect identification system and method for repairing killer defect...