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Oliver Depner
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Saulheim, DE
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last 30 patents
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Patent Grant
Method and device for automatic relative adjustment of samples in r...
Patent number
6,091,499
Issue date
Jul 18, 2000
NanoPhotonics AG
Michael Abraham
G01 - MEASURING TESTING
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Measurement module
Publication number
20030196343
Publication date
Oct 23, 2003
Michael Abraham
H01 - BASIC ELECTRIC ELEMENTS