Oliver FRANK

Person

Linz, AT

People

Patents Grantslast 30 patents

Information Patent Grant
Health monitoring of a circuit
- Patent number 10,955,464
- Issue date Mar 23, 2021
- Infineon Technologies AG
- Vincenzo Fiore
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a semiconductor device by means of computer-ai...
- Patent number 10,761,140
- Issue date Sep 1, 2020
- Infineon Technologies AG
- Oliver Frank
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
RF receiver with built-in test capabilities
- Patent number 10,761,186
- Issue date Sep 1, 2020
- Infineon Technologies AG
- Jochen O. Schrattenecker
- G01 - MEASURING TESTING
Information Patent Grant
Scattering parameter calibration to a semiconductor layer
- Patent number 10,725,138
- Issue date Jul 28, 2020
- Infineon Technologies AG
- Christoph Wagner
- G01 - MEASURING TESTING
Information Patent Grant
RF front-end with power sensor calibration
- Patent number 10,574,367
- Issue date Feb 25, 2020
- Infineon Technologies AG
- Karl Dominizi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device, system and method for automatic test of integrated antennas
- Patent number 10,564,202
- Issue date Feb 18, 2020
- Infineon Technologies AG
- Jochen O. Schrattenecker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
RF receiver with built-in self-test function
- Patent number 10,278,084
- Issue date Apr 30, 2019
- Infineon Technologies AG
- Florian Starzer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated RF circuit with phase-noise test capability
- Patent number 10,205,541
- Issue date Feb 12, 2019
- Infineon Technologies AG
- Oliver Frank
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and method for producing a probe card
- Patent number 10,184,978
- Issue date Jan 22, 2019
- Infineon Technologies AG
- Karl Dominizi
- G01 - MEASURING TESTING
Information Patent Grant
RF front-end with power sensor calibration
- Patent number 10,128,962
- Issue date Nov 13, 2018
- Infineon Technologies AG
- Karl Dominizi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated RF circuit with phase-noise test capability
- Patent number 10,090,939
- Issue date Oct 2, 2018
- Infineon Technologies AG
- Oliver Frank
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
RF receiver with built-in self-test function
- Patent number 10,057,795
- Issue date Aug 21, 2018
- Infineon Technologies AG
- Florian Starzer
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
RF FRONT-END WITH POWER SENSOR CALIBRATION
- Publication number 20190068295
- Publication date Feb 28, 2019
- INFINEON TECHNOLOGIES AG
- Karl DOMINIZI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD FOR PRODUCING A SEMICONDUCTOR DEVICE BY MEANS OF COMPUTER-AI...
- Publication number 20190033373
- Publication date Jan 31, 2019
- Infineon Techonologies AG
- Oliver FRANK
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED RF CIRCUIT WITH PHASE-NOISE TEST CAPABILITY
- Publication number 20180359035
- Publication date Dec 13, 2018
- INFINEON TECHNOLOGIES AG
- Oliver FRANK
- G01 - MEASURING TESTING
Information Patent Application
RF RECEIVER WITH BUILT-IN SELF-TEST FUNCTION
- Publication number 20180332488
- Publication date Nov 15, 2018
- INFINEON TECHNOLOGIES AG
- Florian STARZER
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
HEALTH MONITORING OF A CIRCUIT
- Publication number 20180313893
- Publication date Nov 1, 2018
- INFINEON TECHNOLOGIES AG
- Vincenzo FIORE
- G01 - MEASURING TESTING
Information Patent Application
RF RECEIVER WITH BUILT-IN TEST CAPABILITIES
- Publication number 20180172801
- Publication date Jun 21, 2018
- INFINEON TECHNOLOGIES AG
- Jochen O. SCHRATTENECKER
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED RF CIRCUIT WITH PHASE-NOISE TEST CAPABILITY TECHNICAL FIELD
- Publication number 20180062768
- Publication date Mar 1, 2018
- INFINEON TECHNOLOGIES AG
- Oliver FRANK
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DEVICE, SYSTEM AND METHOD FOR AUTOMATIC TEST OF INTEGRATED ANTENNAS
- Publication number 20180003754
- Publication date Jan 4, 2018
- INFINEON TECHNOLOGIES AG
- Jochen O. Schrattenecker
- G01 - MEASURING TESTING
Information Patent Application
RF RECEIVER WITH BUILT-IN SELF-TEST FUNCTION
- Publication number 20170353876
- Publication date Dec 7, 2017
- INFINEON TECHNOLOGIES AG
- Florian STARZER
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SCATTERING PARAMETER CALIBRATION TO A SEMICONDUCTOR LAYER
- Publication number 20170168132
- Publication date Jun 15, 2017
- INFINEON TECHNOLOGIES AG
- Christoph WAGNER
- G01 - MEASURING TESTING
Information Patent Application
RF FRONT-END WITH POWER SENSOR CALIBRATION
- Publication number 20160329972
- Publication date Nov 10, 2016
- INFINEON TECHNOLOGIES AG
- Karl DOMINIZI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PROBE CARD AND METHOD FOR PRODUCING A PROBE CARD
- Publication number 20150168456
- Publication date Jun 18, 2015
- Karl Dominizi
- G01 - MEASURING TESTING

Oliver FRANK

Person

Patents Grantslast 30 patents

Health monitoring of a circuit

Method for producing a semiconductor device by means of computer-ai...

RF receiver with built-in test capabilities

Scattering parameter calibration to a semiconductor layer

RF front-end with power sensor calibration

Device, system and method for automatic test of integrated antennas

RF receiver with built-in self-test function

Integrated RF circuit with phase-noise test capability

Probe card and method for producing a probe card

RF front-end with power sensor calibration

Integrated RF circuit with phase-noise test capability

RF receiver with built-in self-test function

Patents Applicationslast 30 patents

RF FRONT-END WITH POWER SENSOR CALIBRATION

METHOD FOR PRODUCING A SEMICONDUCTOR DEVICE BY MEANS OF COMPUTER-AI...

INTEGRATED RF CIRCUIT WITH PHASE-NOISE TEST CAPABILITY

RF RECEIVER WITH BUILT-IN SELF-TEST FUNCTION

HEALTH MONITORING OF A CIRCUIT

RF RECEIVER WITH BUILT-IN TEST CAPABILITIES

INTEGRATED RF CIRCUIT WITH PHASE-NOISE TEST CAPABILITY TECHNICAL FIELD

DEVICE, SYSTEM AND METHOD FOR AUTOMATIC TEST OF INTEGRATED ANTENNAS

RF RECEIVER WITH BUILT-IN SELF-TEST FUNCTION

SCATTERING PARAMETER CALIBRATION TO A SEMICONDUCTOR LAYER

RF FRONT-END WITH POWER SENSOR CALIBRATION

PROBE CARD AND METHOD FOR PRODUCING A PROBE CARD