Oliver Genz

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Optical measurement system and method
- Patent number 7,046,363
- Issue date May 16, 2006
- Infineon Technologies AG
- Alexander Michaelis
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for patterning a semiconductor wafer
- Patent number 6,809,800
- Issue date Oct 26, 2004
- Infineon Technologies AG
- Oliver Genz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and method for patterning a semiconductor wafer
- Patent number 6,558,883
- Issue date May 6, 2003
- Infineon Technologies AG
- Oliver Genz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Optical measurement system and method
- Publication number 20040046958
- Publication date Mar 11, 2004
- Infineon Technologies AG
- Alexander Michaelis
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for patterning a semiconductor wafer
- Publication number 20030218727
- Publication date Nov 27, 2003
- Oliver Genz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus and method for patterning a semiconductor wafer
- Publication number 20020127501
- Publication date Sep 12, 2002
- Oliver Genz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY