Oliver KAWALETZ

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Eichstetten, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for checking and calibrating a component
- Patent number 11,131,722
- Issue date Sep 28, 2021
- Micronas GmbH
- Oliver Kawaletz
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a CMOS transistor
- Patent number 9,410,921
- Issue date Aug 9, 2016
- Micronas GmbH
- Oliver Kawaletz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for checking and calibrating a component
- Publication number 20200200836
- Publication date Jun 25, 2020
- TDK - Micronas GmbH
- Oliver Kawaletz
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A CMOS TRANSISTOR
- Publication number 20150268190
- Publication date Sep 24, 2015
- Micronas GmbH
- Oliver KAWALETZ
- G01 - MEASURING TESTING