Oliver Nagler

Follow

Person

Munich, DE

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for examining semiconductor substrates
- Patent number 10,859,534
- Issue date Dec 8, 2020
- Infineon Technologies AG
- Oliver Nagler
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probing
- Patent number 10,598,480
- Issue date Mar 24, 2020
- Infineon Technologies AG
- Ivan Penjovic
- G01 - MEASURING TESTING
Information Patent Grant
Probe-pad qualification
- Patent number 9,885,749
- Issue date Feb 6, 2018
- Infineon Technologies AG
- Ivan Penjovic
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structure integrated under a pad
- Patent number 7,190,077
- Issue date Mar 13, 2007
- Infineon Technologies AG
- Robert Bauer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microsensor with a resonator structure
- Patent number 6,389,898
- Issue date May 21, 2002
- DaimlerChrysler AG
- Helmut Seidel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR THE ACOUSTIC DETECTION OF CRACKS IN A SEMICON...
- Publication number 20220050083
- Publication date Feb 17, 2022
- INFINEON TECHNOLOGIES AG
- Oliver NAGLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR EXAMINING SEMICONDUCTOR SUBSTRATES
- Publication number 20190178848
- Publication date Jun 13, 2019
- INFINEON TECHNOLOGIES AG
- Oliver Nagler
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBING
- Publication number 20170292832
- Publication date Oct 12, 2017
- INFINEON TECHNOLOGIES AG
- Ivan Penjovic
- G01 - MEASURING TESTING
Information Patent Application
PROBE-PAD QUALIFICATION
- Publication number 20160356844
- Publication date Dec 8, 2016
- INFINEON TECHNOLOGIES AG
- Ivan PENJOVIC
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor structure integrated under a pad
- Publication number 20050242374
- Publication date Nov 3, 2005
- Robert Bauer
- H01 - BASIC ELECTRIC ELEMENTS