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Oliver RÄTHER
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Lilienthal, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Saturation correction for ion signals in time-of-flight mass spectr...
Patent number
11,373,848
Issue date
Jun 28, 2022
Oliver Rather
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Determining the reduced ion mobility of ion species by trapped ion...
Patent number
11,226,308
Issue date
Jan 18, 2022
Oliver Räther
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for controlling the mass filter in a hybrid IMS/MS system
Patent number
11,047,828
Issue date
Jun 29, 2021
Oliver Räther
G01 - MEASURING TESTING
Information
Patent Grant
Trapped ion mobility spectrometer with high ion storage capacity
Patent number
10,989,690
Issue date
Apr 27, 2021
Oliver Räther
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Trapped ion mobility spectrometer with high ion storage capacity
Patent number
10,458,944
Issue date
Oct 29, 2019
Oliver Räther
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spatial zoom mode for accumulative trapped ion mobility spectrometry
Patent number
9,984,864
Issue date
May 29, 2018
Oliver Räther
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Acquisition of fragment ion mass spectra of ions separated by their...
Patent number
9,891,194
Issue date
Feb 13, 2018
Bruker Daltonik GmbH
Matthias Mann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spatial zoom mode for accumulative trapped ion mobility spectrometry
Patent number
9,546,980
Issue date
Jan 17, 2017
Oliver Räther
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Saturation correction for ion signals in time-of-flight mass spectr...
Patent number
9,324,544
Issue date
Apr 26, 2016
Bruker Daltonik GmbH
Oliver Rather
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High duty cycle trapping ion mobility spectrometer
Patent number
9,304,106
Issue date
Apr 5, 2016
Melvin Andrew Park
G01 - MEASURING TESTING
Information
Patent Grant
Method for operating a time-of-flight mass spectrometer with orthog...
Patent number
8,927,928
Issue date
Jan 6, 2015
Bruker Daltonik GmbH
Petra Decker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Calibration function for time-of-flight mass spectrometers with ext...
Patent number
8,581,183
Issue date
Nov 12, 2013
Bruker Daltonik GmbH
Oliver Räther
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion manipulation cell with tailored potential profiles
Patent number
8,410,429
Issue date
Apr 2, 2013
Bruker Daltonik GmbH
Jochen Franzen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion mobility measurement at a potential barrier
Patent number
8,080,787
Issue date
Dec 20, 2011
Bruker Daltonik GmbH
Oliver Räther
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for avoiding undesirable mass dispersion of io...
Patent number
8,013,290
Issue date
Sep 6, 2011
Bruker Daltonik GmbH
Oliver Räther
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Generation of multiply charged ions for tandem mass spectrometry
Patent number
7,446,312
Issue date
Nov 4, 2008
Bruker Daltonik, GmbH
Oliver Räther
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time-of-flight mass spectrometers with orthogonal ion injection
Patent number
7,223,966
Issue date
May 29, 2007
Bruker Daltonik, GmbH
Gerhard Weiss
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pulsers for time-of-flight mass spectrometers with orthogonal ion i...
Patent number
6,903,332
Issue date
Jun 7, 2005
Bruker Daltonik GmbH
Gerhard Weiss
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High resolution detection for time-of-flight mass spectrometers
Patent number
6,870,156
Issue date
Mar 22, 2005
Bruker Daltonik, GmbH
Oliver Räther
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for separating selected materials in a gas chromatograph and...
Patent number
5,979,221
Issue date
Nov 9, 1999
WMA Airsense Analysentechnik GmbH
Andreas Walte
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND DEVICE FOR THE QUANTIFICATION OF TARGET ION SPECIES
Publication number
20230028227
Publication date
Jan 26, 2023
Bruker Daltonics GmbH & Co. KG
Oliver RÄTHER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR CONTROLLING THE MASS FILTER IN A HYBRID IMS/MS SYSTEM
Publication number
20200326302
Publication date
Oct 15, 2020
Bruker Daltonik GmbH
Oliver RÄTHER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETERMINING THE REDUCED ION MOBILITY OF ION SPECIES BY TRAPPED ION...
Publication number
20200103373
Publication date
Apr 2, 2020
Bruker Daltonik GmbH
Oliver RÄTHER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TRAPPED ION MOBILITY SPECTROMETER WITH HIGH ION STORAGE CAPACITY
Publication number
20200049660
Publication date
Feb 13, 2020
Bruker Daltonik GmbH
Oliver RÄTHER
G01 - MEASURING TESTING
Information
Patent Application
TRAPPED ION MOBILITY SPECTROMETER WITH HIGH ION STORAGE CAPACITY
Publication number
20170350860
Publication date
Dec 7, 2017
Bruker Daltonik GmbH
Oliver RÄTHER
G01 - MEASURING TESTING
Information
Patent Application
SPATIAL ZOOM MODE FOR ACCUMULATIVE TRAPPED ION MOBILITY SPECTROMETRY
Publication number
20170125234
Publication date
May 4, 2017
Bruker Daltonik GmbH
Oliver RÄTHER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ACQUISITION OF FRAGMENT ION MASS SPECTRA OF IONS SEPARATED BY THEIR...
Publication number
20170122906
Publication date
May 4, 2017
Matthias MANN
G01 - MEASURING TESTING
Information
Patent Application
SATURATION CORRECTION FOR ION SIGNALS IN TIME-OF-FLIGHT MASS SPECTR...
Publication number
20150371836
Publication date
Dec 24, 2015
Oliver Räther
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SATURATION CORRECTION FOR ION SIGNALS IN TIME-OF-FLIGHT MASS SPECTR...
Publication number
20130181123
Publication date
Jul 18, 2013
Oliver Räther
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR OPERATING A TIME-OF-FLIGHT MASS SPECTROMETER WITH ORTHOG...
Publication number
20120280118
Publication date
Nov 8, 2012
Petra Decker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CALIBRATION FUNCTION FOR TIME-OF-FLIGHT MASS SPECTROMETERS WITH EXT...
Publication number
20120074303
Publication date
Mar 29, 2012
Bruker Daltonik GmbH
Oliver Rather
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SATURATION CORRECTION FOR ION SIGNALS IN TIME-OF-FLIGHT MASS SPECTR...
Publication number
20110226943
Publication date
Sep 22, 2011
Oliver Räther
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION MANIPULATION CELL WITH TAILORED POTENTIAL PROFILES
Publication number
20110186728
Publication date
Aug 4, 2011
Jochen Franzen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION MOBILITY MEASUREMENT AT A POTENTIAL BARRIER
Publication number
20100090102
Publication date
Apr 15, 2010
Bruker Daltonik GmbH
Oliver Räther
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR AVOIDING UNDESIRABLE MASS DISPERSION OF IO...
Publication number
20080156980
Publication date
Jul 3, 2008
Bruker Daltonik GmbH
Oliver Rather
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Generation of multiply charged ions for tandem mass spectrometry
Publication number
20070051886
Publication date
Mar 8, 2007
Bruker Daltonik GmbH
Oliver Rather
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High resolution detection for time-of-flight mass
Publication number
20030218129
Publication date
Nov 27, 2003
Bruker Daltonik GmbH
Oliver Rather
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Pulsers for time-of-flight mass spectrometers with orthogonal ion i...
Publication number
20030168590
Publication date
Sep 11, 2003
Bruker Daltonik GmbH
Gerhard Weiss
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Time-of-flight mass spectrometers with orthogonal ion injection
Publication number
20030136903
Publication date
Jul 24, 2003
Bruker Daltonik GmbH
Gerhard Weiss
H01 - BASIC ELECTRIC ELEMENTS