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Olivier Le Neel
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Irving, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Device and method for testing magnetic switches at wafer-level stag...
Patent number
8,451,016
Issue date
May 28, 2013
STMicroelectronics Pte Ltd
Ravi Shankar
G01 - MEASURING TESTING
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Patent Grant
Portable device for storing private information such as medical, fi...
Patent number
8,219,771
Issue date
Jul 10, 2012
STMicroelectronics, Inc.
Olivier Le Neel
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
DEVICE AND METHOD FOR TESTING MAGNETIC SWITCHES AT WAFER-LEVEL STAG...
Publication number
20110156712
Publication date
Jun 30, 2011
STMicroelectronics Asia Pacific Pte. Ltd.
Ravi Shankar
G01 - MEASURING TESTING