Olivier Moreau

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Determining multi-patterning step overlay error
- Patent number 10,062,543
- Issue date Aug 28, 2018
- KLA-Tencor Corp.
- Ajay Gupta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Range-based real-time scanning electron microscope non-visual binner
- Patent number 9,947,596
- Issue date Apr 17, 2018
- KLA-Tencor Corporation
- Hemanta Kumar Roy
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Range-Based Real-Time Scanning Electron Microscope Non-Visual Binner
- Publication number 20170040142
- Publication date Feb 9, 2017
- KLA-Tencor Corporation
- Hemanta Kumar Roy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETERMINING MULTI-PATTERNING STEP OVERLAY ERROR
- Publication number 20160377425
- Publication date Dec 29, 2016
- KLA-Tencor Corporation
- Ajay Gupta
- G01 - MEASURING TESTING