Membership
Tour
Register
Log in
Olivier Vincent Doare
Follow
Person
La Salvetat St Gilles, FR
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method, device, and radar system
Patent number
12,061,282
Issue date
Aug 13, 2024
NXP USA, INC.
Olivier Vincent Doaré
G01 - MEASURING TESTING
Information
Patent Grant
Built in self test transmitter phase calibration
Patent number
11,656,330
Issue date
May 23, 2023
NXP USA, INC.
Olivier Vincent Doare
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Phase rotator calibration apparatus and method therefor
Patent number
11,496,122
Issue date
Nov 8, 2022
NXP USA, INC.
Dominique Delbecq
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Phase rotator calibration of a multichannel radar transmitter
Patent number
11,460,542
Issue date
Oct 4, 2022
NXP USA, INC.
Olivier Vincent Doare
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Communication unit and method for clock distribution and synchroniz...
Patent number
11,320,526
Issue date
May 3, 2022
NXP USA, INC.
Didier Salle
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Communication unit, integrated circuits and method for clock and da...
Patent number
11,054,513
Issue date
Jul 6, 2021
NXP USA, INC.
Olivier Doaré
G01 - MEASURING TESTING
Information
Patent Grant
Time-encoded messaging for radar cascaded synchronization system
Patent number
11,018,844
Issue date
May 25, 2021
NXP USA, INC.
Andres Barrilado Gonzalez
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensor and calibration method thereof having high accuracy
Patent number
10,648,870
Issue date
May 12, 2020
NXP USA, INC.
Birama Goumballa
G05 - CONTROLLING REGULATING
Information
Patent Grant
System and method for calibrating a time to digital converter device
Patent number
10,579,021
Issue date
Mar 3, 2020
NXP USA, INC.
Didier Salle
G04 - HOROLOGY
Information
Patent Grant
Digital synthesizer, communication unit and method therefor
Patent number
10,496,040
Issue date
Dec 3, 2019
NXP USA, INC.
Didier Salle
G01 - MEASURING TESTING
Information
Patent Grant
Digitally controlled oscillator with temperature compensation
Patent number
10,454,482
Issue date
Oct 22, 2019
NXP USA, INC.
Cristian Pavao-Moreira
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Digital synthesizer, communication unit and method therefor
Patent number
10,367,464
Issue date
Jul 30, 2019
NXP USA, INC.
Didier Salle
G01 - MEASURING TESTING
Information
Patent Grant
Integrated calibration circuit and a method for calibration of a fi...
Patent number
10,250,213
Issue date
Apr 2, 2019
NXP USA, Inx.
Cristian Pavao-Moreira
G01 - MEASURING TESTING
Information
Patent Grant
Digital synthesizer, communication unit and method therefor
Patent number
10,236,898
Issue date
Mar 19, 2019
NXP USA, INC.
Didier Salle
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for calibrating a digitally controlled oscillator
Patent number
10,103,740
Issue date
Oct 16, 2018
NXP USA, INC.
Cristian Pavao-Moreira
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Digital synthesizer, radar device and method therefor
Patent number
10,097,187
Issue date
Oct 9, 2018
NXP USA, INC.
Olivier Vincent Doare
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for generating phase shift control signals
Patent number
9,973,360
Issue date
May 15, 2018
NXP USA, INC.
Olivier Vincent Doare
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Calibration method and apparatus for high TDC resolution
Patent number
9,897,975
Issue date
Feb 20, 2018
NXP USA, INC.
Didier Salle
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Integrated circuit, radar device and method of calibrating a receiver
Patent number
9,835,715
Issue date
Dec 5, 2017
NXP USA, INC.
Dominique Delbecq
G01 - MEASURING TESTING
Information
Patent Grant
Circuitry for and method of generating a frequency modulated radar...
Patent number
9,720,074
Issue date
Aug 1, 2017
NXP USA, INC.
Didier Salle
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Integrated circuit device, electronic device and method for frequen...
Patent number
9,722,648
Issue date
Aug 1, 2017
NXP USA, INC.
Philippe Freitas
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Electronic device with capacitor bank linearization and a lineariza...
Patent number
9,660,578
Issue date
May 23, 2017
NXP USA, INC.
Cristian Pavao-Moreira
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Test signal generator for sigma-delta ADC
Patent number
9,401,728
Issue date
Jul 26, 2016
FREESCALE SEMICONDUCTOR, INC.
Olivier Vincent Doare
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
XOR phase detector, phase-locked loop, and method of operating a PLL
Patent number
9,401,723
Issue date
Jul 26, 2016
FREESCALE SEMICONDUCTOR, INC.
Gilles Montoriol
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Circuit generating an analog signal using a part of a sigma-delta ADC
Patent number
9,350,381
Issue date
May 24, 2016
Freescale Semiconductor Inc.
Olivier Vincent Doare
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Clock for serial communication device
Patent number
9,197,394
Issue date
Nov 24, 2015
FREESCALE SEMICONDUCTOR, INC.
Olivier Doare
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Integrated circuit comprising frequency generation circuitry for co...
Patent number
8,731,502
Issue date
May 20, 2014
FREESCALE SEMICONDUCTOR, INC.
Didier Salle
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TIME-CONTINUOUS POWER MONITORING FOR RADAR APPLICATIONS
Publication number
20240012107
Publication date
Jan 11, 2024
NXP B.V.
Yi YIN
G01 - MEASURING TESTING
Information
Patent Application
METHOD, DEVICE, AND RADAR SYSTEM
Publication number
20220196791
Publication date
Jun 23, 2022
NXP USA, Inc.
Olivier Vincent Doaré
G01 - MEASURING TESTING
Information
Patent Application
PHASE ROTATOR CALIBRATION APPARATUS AND METHOD THEREFOR
Publication number
20220021378
Publication date
Jan 20, 2022
NXP USA, Inc.
Dominique Delbecq
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
BUILT IN SELF TEST TRANSMITTER PHASE CALIBRATION
Publication number
20200400783
Publication date
Dec 24, 2020
NXP USA, Inc.
Olivier Vincent Doare
G01 - MEASURING TESTING
Information
Patent Application
PHASE ROTATOR CALIBRATION OF A MULTICHANNEL RADAR TRANSMITTER
Publication number
20200158821
Publication date
May 21, 2020
NXP USA, Inc.
Olivier Vincent Doare
G01 - MEASURING TESTING
Information
Patent Application
COMMUNICATION UNIT AND METHOD FOR CLOCK DISTRIBUTION AND SYNCHRONIZ...
Publication number
20200003882
Publication date
Jan 2, 2020
NXP USA, Inc.
Didier Salle
G01 - MEASURING TESTING
Information
Patent Application
COMMUNICATION UNIT, INTEGRATED CIRCUITS AND METHOD FOR CLOCK AND DA...
Publication number
20200003862
Publication date
Jan 2, 2020
NXP USA, Inc.
Olivier Doaré
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COMMUNICATION UNIT, INTEGRATED CIRCUITS AND METHOD FOR CLOCK AND DA...
Publication number
20200003883
Publication date
Jan 2, 2020
NXP USA, Inc.
Olivier Doaré
G01 - MEASURING TESTING
Information
Patent Application
TIME-ENCODED MESSAGING FOR RADAR CASCADED SYNCHRONIZATION SYSTEM
Publication number
20190386810
Publication date
Dec 19, 2019
NXP USA, Inc.
Andres Barrilado Gonzalez
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL SYNTHESIZER, COMMUNICATION UNIT AND METHOD THEREFOR
Publication number
20180181077
Publication date
Jun 28, 2018
NXP USA, Inc.
Didier SALLE
G04 - HOROLOGY
Information
Patent Application
DIGITALLY CONTROLLED OSCILLATOR WITH TEMPERATURE COMPENSATION
Publication number
20180183442
Publication date
Jun 28, 2018
NXP USA, Inc.
Cristian Pavao Moreira
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SYSTEM AND METHOD FOR CALIBRATING A TIME TO DIGITAL CONVERTER DEVICE
Publication number
20180164748
Publication date
Jun 14, 2018
NXP USA, Inc.
Didier SALLE
G04 - HOROLOGY
Information
Patent Application
DIGITAL SYNTHESIZER, RADAR DEVICE AND METHOD THEREFOR
Publication number
20180145692
Publication date
May 24, 2018
NXP USA, Inc.
Olivier Vincent DOARE
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
DIGITAL SYNTHESIZER, COMMUNICATION UNIT AND METHOD THEREFOR
Publication number
20180123537
Publication date
May 3, 2018
NXP USA, Inc.
Didier SALLE
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
DIGITAL SYNTHESIZER, COMMUNICATION UNIT AND METHOD THEREFOR
Publication number
20180123605
Publication date
May 3, 2018
NXP USA, Inc.
Didier SALLE
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE SENSOR AND CALIBRATION METHOD THEREOF HAVING HIGH ACCURACY
Publication number
20170307451
Publication date
Oct 26, 2017
NXP USA, Inc.
Birama GOUMBALLA
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION METHOD AND APPARATUS FOR HIGH TDC RESOLUTION
Publication number
20170293265
Publication date
Oct 12, 2017
NXP USA, Inc.
Didier Salle
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHOD AND APPARATUS FOR GENERATING PHASE SHIFT CONTROL SIGNALS
Publication number
20170180169
Publication date
Jun 22, 2017
NXP USA, Inc.
Olivier Vincent Doare
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR CALIBRATING A DIGITALLY CONTROLLED OSCILLATOR
Publication number
20170126237
Publication date
May 4, 2017
FREESCALE SEMICONDUCTOR, INC.
Cristian PAVAO-MOREIRA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ELECTRONIC DEVICE WITH CAPACITOR BANK LINEARIZATION AND A LINEARIZA...
Publication number
20170040943
Publication date
Feb 9, 2017
FREESCALE SEMICONDUCTOR, INC.
Cristian PAVAO-MOREIRA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
INTEGRATED CALIBRATION CIRCUIT AND A METHOD FOR CALIBRATION OF A FI...
Publication number
20160233846
Publication date
Aug 11, 2016
Cristian Pavao-Moreira
G01 - MEASURING TESTING
Information
Patent Application
XOR PHASE DETECTOR, PHASE-LOCKED LOOP, AND METHOD OF OPERATING A PLL
Publication number
20160173109
Publication date
Jun 16, 2016
FREESCALE SEMICONDUCTOR, INC.
GILLES MONTORIOL
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TEST SIGNAL GENERATOR FOR SIGMA-DELTA ADC
Publication number
20160173120
Publication date
Jun 16, 2016
FREESCALE SEMICONDUCTOR, INC.
OLIVIER VINCENT DOARE
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
CIRCUIT GENERATING AN ANALOG SIGNAL USING A PART OF A SIGMA-DELTA ADC
Publication number
20160173121
Publication date
Jun 16, 2016
FREESCALE SEMICONDUCTOR, INC.
OLIVIER VINCENT DOARE
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
INTEGRATED CIRCUIT, RADAR DEVICE AND METHOD OF CALIBRATING A RECEIVER
Publication number
20160109559
Publication date
Apr 21, 2016
FREESCALE SEMICONDUCTOR, INC.
DOMINIQUE DELBECQ
G01 - MEASURING TESTING
Information
Patent Application
CIRCUITRY FOR AND METHOD OF GENERATING A FREQUENCY MODULATED RADAR...
Publication number
20150219753
Publication date
Aug 6, 2015
FREESCALE SEMICONDUCTOR, INC.
DIDIER SALLE
G01 - MEASURING TESTING
Information
Patent Application
CLOCK FOR SERIAL COMMUNICATION DEVICE
Publication number
20150163046
Publication date
Jun 11, 2015
FREESCALE SEMICONDUCTOR, INC.
Olivier Doare
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
INTEGRATED CIRCUIT DEVICE, ELECTRONIC DEVICE AND METHOD FOR FREQUEN...
Publication number
20130331050
Publication date
Dec 12, 2013
FREESCALE SEMICONDUCTOR, INC.
Philippe Freitas
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
INTEGRATED CIRCUIT COMPRISING FREQUENCY GENERATION CIRCUITRY FOR CO...
Publication number
20110298506
Publication date
Dec 8, 2011
FREESCALE SEMICONDUCTOR, INC.
Didier Salle
H03 - BASIC ELECTRONIC CIRCUITRY