Oluwafemi O. Ogunsola

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Hopewell Junction, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method to reduce depth delta between dense and wide features in dua...
- Patent number 8,822,342
- Issue date Sep 2, 2014
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Ravi Prakash Srivastava
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of reducing critical dimension process bias differences betw...
- Patent number 8,450,212
- Issue date May 28, 2013
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE PATTERNING METHOD FOR SUBSTRATE
- Publication number 20170170016
- Publication date Jun 15, 2017
- GLOBALFOUNDRIES INC.
- Woo-Hyeong Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF REDUCING CRITICAL DIMENSION PROCESS BIAS DIFFERENCES BETW...
- Publication number 20130005147
- Publication date Jan 3, 2013
- International Business Machines Corporation
- Matthew S. Angyal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO REDUCE DEPTH DELTA BETWEEN DENSE AND WIDE FEATURES IN DUA...
- Publication number 20120168957
- Publication date Jul 5, 2012
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Ravi Prakash SRIVASTAVA
- H01 - BASIC ELECTRIC ELEMENTS