Omar Elsewefy

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Giza, EG

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Patents Grantslast 30 patents

Information Patent Grant
Controllable pattern clustering for characterized semiconductor lay...
- Patent number 12,182,487
- Issue date Dec 31, 2024
- SIEMENS INDUSTRY SOFTWARE INC.
- Hazem Hegazy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shadow feature-based determination of capacitance values for integr...
- Patent number 11,687,695
- Issue date Jun 27, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Omar Elsewefy
- G01 - MEASURING TESTING
Information Patent Grant
Edge-based camera for characterizing semiconductor layout designs
- Patent number 11,017,147
- Issue date May 25, 2021
- SIEMENS INDUSTRY SOFTWARE INC.
- Hazem Hegazy
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
EDGE CENTER POINT-BASED CHARACTERIZATION OF SEMICONDUCTOR LAYOUT DE...
- Publication number 20240071038
- Publication date Feb 29, 2024
- Siemens Industry Software Inc.
- Hazem Hegazy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLABLE PATTERN CLUSTERING FOR CHARACTERIZED SEMICONDUCTOR LAY...
- Publication number 20230069262
- Publication date Mar 2, 2023
- Siemens Industry Software Inc.
- Hazem Hegazy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHADOW FEATURE-BASED DETERMINATION OF CAPACITANCE VALUES FOR INTEGR...
- Publication number 20220318479
- Publication date Oct 6, 2022
- Siemens Industry Software Inc.
- Omar Elsewefy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Edge-Based Camera for Characterizing Semiconductor Layout Designs
- Publication number 20210064717
- Publication date Mar 4, 2021
- Mentor Graphics Corporation
- Hazem Hegazy
- G06 - COMPUTING CALCULATING COUNTING