Omar Zurita

Person

San Diego, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Hyperspectral sensing system and processing methods for hyperspectr...
- Patent number 12,072,242
- Issue date Aug 27, 2024
- Flying Gybe Inc.
- Nicholas Tufillaro
- G01 - MEASURING TESTING
Information Patent Grant
Hyperspectral sensing system and methods
- Patent number 11,650,190
- Issue date May 16, 2023
- Flying Gybe Inc.
- Nicholas Tufillaro
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hyperspectral sensing system and processing methods for hyperspectr...
- Patent number 11,073,423
- Issue date Jul 27, 2021
- Flying Gybe Inc.
- Nicholas Tufillaro
- G01 - MEASURING TESTING
Information Patent Grant
Lithography optics adjustment and monitoring
- Patent number 10,845,711
- Issue date Nov 24, 2020
- Cymer, LLC
- Thomas Frederick Allen Bibby
- G01 - MEASURING TESTING
Information Patent Grant
Lithography optics adjustment and monitoring
- Patent number 10,345,714
- Issue date Jul 9, 2019
- Cymer, LLC
- Thomas Frederick Allen Bibby
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wafer-based light source parameter control
- Patent number 10,268,123
- Issue date Apr 23, 2019
- Cymer, LLC
- Eric Anders Mason
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wafer-based light source parameter control
- Patent number 10,036,960
- Issue date Jul 31, 2018
- Cymer, LLC
- Ivan Lalovic
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wafer-based light source parameter control
- Patent number 9,989,866
- Issue date Jun 5, 2018
- Cymer, LLC
- Eric Anders Mason
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wafer-based light source parameter control
- Patent number 9,715,180
- Issue date Jul 25, 2017
- Cymer, LLC
- Ivan Lalovic
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Polarization control of pulsed light beam
- Patent number 9,709,897
- Issue date Jul 18, 2017
- Cymer, LLC
- Eric Anders Mason
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
HYPERSPECTRAL SENSING SYSTEM AND PROCESSING METHODS FOR HYPERSPECTR...
- Publication number 20210231497
- Publication date Jul 29, 2021
- Flying Gybe Inc.
- Nicholas TUFILLARO
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL SENSING SYSTEM AND PROCESSING METHODS FOR HYPERSPECTR...
- Publication number 20210231498
- Publication date Jul 29, 2021
- Flying Gybe Inc.
- Nicholas TUFILLARO
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL SENSING SYSTEM AND METHODS
- Publication number 20210033589
- Publication date Feb 4, 2021
- Flying Gybe Inc.
- Nicholas TUFILLARO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYPERSPECTRAL SENSING SYSTEM AND PROCESSING METHODS FOR HYPERSPECTR...
- Publication number 20200025613
- Publication date Jan 23, 2020
- Flying Gybe Inc.
- Nicholas TUFILLARO
- G01 - MEASURING TESTING
Information Patent Application
LITHOGRAPHY OPTICS ADJUSTMENT AND MONITORING
- Publication number 20190310558
- Publication date Oct 10, 2019
- CYMER, LLC
- Thomas Frederick Allen Bibby
- G01 - MEASURING TESTING
Information Patent Application
WAFER-BASED LIGHT SOURCE PARAMETER CONTROL
- Publication number 20180164697
- Publication date Jun 14, 2018
- CYMER, LLC
- Eric Anders Mason
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
WAFER-BASED LIGHT SOURCE PARAMETER CONTROL
- Publication number 20180107123
- Publication date Apr 19, 2018
- CYMER, LLC
- Eric Anders Mason
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LITHOGRAPHY OPTICS ADJUSTMENT AND MONITORING
- Publication number 20180017878
- Publication date Jan 18, 2018
- CYMER, LLC
- Thomas Frederick Allen Bibby
- G01 - MEASURING TESTING
Information Patent Application
WAFER-BASED LIGHT SOURCE PARAMETER CONTROL
- Publication number 20180011409
- Publication date Jan 11, 2018
- CYMER, LLC
- Ivan Lalovic
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
POLARIZATION CONTROL OF PULSED LIGHT BEAM
- Publication number 20170123324
- Publication date May 4, 2017
- CYMER, LLC
- Eric Anders Mason
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
WAFER-BASED LIGHT SOURCE PARAMETER CONTROL
- Publication number 20150070673
- Publication date Mar 12, 2015
- CYMER, LLC
- Ivan Lalovic
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Omar Zurita

Person

Patents Grantslast 30 patents

Hyperspectral sensing system and processing methods for hyperspectr...

Hyperspectral sensing system and methods

Hyperspectral sensing system and processing methods for hyperspectr...

Lithography optics adjustment and monitoring

Lithography optics adjustment and monitoring

Wafer-based light source parameter control

Wafer-based light source parameter control

Wafer-based light source parameter control

Wafer-based light source parameter control

Polarization control of pulsed light beam

Patents Applicationslast 30 patents

HYPERSPECTRAL SENSING SYSTEM AND PROCESSING METHODS FOR HYPERSPECTR...

HYPERSPECTRAL SENSING SYSTEM AND PROCESSING METHODS FOR HYPERSPECTR...

HYPERSPECTRAL SENSING SYSTEM AND METHODS

HYPERSPECTRAL SENSING SYSTEM AND PROCESSING METHODS FOR HYPERSPECTR...

LITHOGRAPHY OPTICS ADJUSTMENT AND MONITORING

WAFER-BASED LIGHT SOURCE PARAMETER CONTROL

WAFER-BASED LIGHT SOURCE PARAMETER CONTROL

LITHOGRAPHY OPTICS ADJUSTMENT AND MONITORING

WAFER-BASED LIGHT SOURCE PARAMETER CONTROL

POLARIZATION CONTROL OF PULSED LIGHT BEAM

WAFER-BASED LIGHT SOURCE PARAMETER CONTROL