Ondrej L. Krivanek

Person

Oakland, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Precision-controlled slit mechanism for electron microscope
- Patent number 5,640,012
- Issue date Jun 17, 1997
- Gatan, Inc.
- Ondrej L. Krivanek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resolution-enhancement device for an optically-coupled image sensor...
- Patent number 5,635,720
- Issue date Jun 3, 1997
- Gatan, Inc.
- Paul E. Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for improved image resolution in electron microscopy
- Patent number 5,517,033
- Issue date May 14, 1996
- Gatan, Inc.
- Ondrej L. Krivanek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Autoadjusting electron microscope
- Patent number 5,300,776
- Issue date Apr 5, 1994
- Gatan, Inc.
- Ondrej L. Krivanek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution electron energy loss spectrometer
- Patent number 5,097,126
- Issue date Mar 17, 1992
- Gatan, Inc.
- Ondrej L. Krivanek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cooled CCD camera for an electron microscope
- Patent number 5,065,029
- Issue date Nov 12, 1991
- Gatan, Inc.
- Ondrej L. Krivanek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy-selected electron imaging filter
- Patent number 4,851,670
- Issue date Jul 25, 1989
- Gatan Inc.
- Ondrej L. Krivanek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable-attenuation parallel detector
- Patent number 4,831,255
- Issue date May 16, 1989
- Gatan, Inc.
- Ondrej L. Krivanek
- G01 - MEASURING TESTING
Information Patent Grant
Parallel-detection electron energy-loss spectrometer
- Patent number 4,743,756
- Issue date May 10, 1988
- Gatan Inc.
- Ondrej L. Krivanek
- H01 - BASIC ELECTRIC ELEMENTS

Ondrej L. Krivanek

Person

Patents Grantslast 30 patents

Precision-controlled slit mechanism for electron microscope

Resolution-enhancement device for an optically-coupled image sensor...

Apparatus for improved image resolution in electron microscopy

Autoadjusting electron microscope

High resolution electron energy loss spectrometer

Cooled CCD camera for an electron microscope

Energy-selected electron imaging filter

Variable-attenuation parallel detector

Parallel-detection electron energy-loss spectrometer