Ondrej Shanel

Person

Vrbno pod Pradedem, CZ

People

Patents Grantslast 30 patents

Information Patent Grant
Device and method for determining a property of a sample that is to...
- Patent number 11,587,762
- Issue date Feb 21, 2023
- FEI Company
- Maarten Kuijper
- G01 - MEASURING TESTING
Information Patent Grant
Illumination apertures for extended sample lifetimes in helical tom...
- Patent number 11,430,633
- Issue date Aug 30, 2022
- FEI Company
- Ondrej L. Shanel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi modal cryo compatible GUID grid
- Patent number 11,101,104
- Issue date Aug 24, 2021
- FEI Company
- Maarten Kuijper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Innovative X-ray source for use in tomographic imaging
- Patent number 10,520,454
- Issue date Dec 31, 2019
- FEI Company
- Petr Strelec
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic lens for focusing a beam of charged particles
- Patent number 9,595,359
- Issue date Mar 14, 2017
- FEI Company
- Ondrej Shanel
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
Systems And Methods For Transferring A Sample
- Publication number 20240112879
- Publication date Apr 4, 2024
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR HANDLING SAMPLES FOR STUDY IN A CHARGED PARTI...
- Publication number 20230298849
- Publication date Sep 21, 2023
- FEI Company
- Jirí Benda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF ALIGNIN...
- Publication number 20230282443
- Publication date Sep 7, 2023
- Shânêl Ondrej
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEAM TRAJECTORY VIA COMBINATION OF IMAGE SHIFT AND HARDWARE ALPHA TILT
- Publication number 20220310354
- Publication date Sep 29, 2022
- FEI Company
- Ondrej L. Shánel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ILLUMINATION APERTURES FOR EXTENDED SAMPLE LIFETIMES IN HELICAL TOM...
- Publication number 20220208511
- Publication date Jun 30, 2022
- FEI Company
- Ondrej L. Shanel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR DETERMINING A PROPERTY OF A SAMPLE THAT IS TO...
- Publication number 20210257183
- Publication date Aug 19, 2021
- FEI Company
- Maarten Kuijper
- G01 - MEASURING TESTING
Information Patent Application
MULTI MODAL CRYO COMPATIBLE GUID GRID
- Publication number 20210066032
- Publication date Mar 4, 2021
- FEI Company
- Maarten Kuijper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INNOVATIVE X-RAY SOURCE FOR USE IN TOMOGRAPHIC IMAGING
- Publication number 20180323032
- Publication date Nov 8, 2018
- FEI Company
- PETR STRELEC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC LENS FOR FOCUSING A BEAM OF CHARGED PARTICLES
- Publication number 20150021476
- Publication date Jan 22, 2015
- FEI Company
- Ondrej Shanel
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Ondrej Shanel

Person

Patents Grantslast 30 patents

Device and method for determining a property of a sample that is to...

Illumination apertures for extended sample lifetimes in helical tom...

Multi modal cryo compatible GUID grid

Innovative X-ray source for use in tomographic imaging

Magnetic lens for focusing a beam of charged particles

Patents Applicationslast 30 patents

Systems And Methods For Transferring A Sample

SYSTEM AND METHOD FOR HANDLING SAMPLES FOR STUDY IN A CHARGED PARTI...

TRANSMISSION CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF ALIGNIN...

BEAM TRAJECTORY VIA COMBINATION OF IMAGE SHIFT AND HARDWARE ALPHA TILT

ILLUMINATION APERTURES FOR EXTENDED SAMPLE LIFETIMES IN HELICAL TOM...

DEVICE AND METHOD FOR DETERMINING A PROPERTY OF A SAMPLE THAT IS TO...

MULTI MODAL CRYO COMPATIBLE GUID GRID

INNOVATIVE X-RAY SOURCE FOR USE IN TOMOGRAPHIC IMAGING

MAGNETIC LENS FOR FOCUSING A BEAM OF CHARGED PARTICLES