Ophir Peleg

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Moshav Amirim, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for low cost inspection
- Patent number 10,197,505
- Issue date Feb 5, 2019
- CAMTEK LTD.
- Ophir Peleg
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inspecting an object
- Patent number 8,514,385
- Issue date Aug 20, 2013
- Camtek Ltd.
- Meir Ben-Levy
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR INSPECTING AN OBJECT
- Publication number 20110310392
- Publication date Dec 22, 2011
- Camtek Ltd.
- Meir Ben-Levy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR LOW COST INSPECTION
- Publication number 20110164806
- Publication date Jul 7, 2011
- CAMTEK LTD
- Ophir Peleg
- G01 - MEASURING TESTING