Ore SHTALRID

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Yavne, IL

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Patents Grantslast 30 patents

Information Patent Grant
Machine learning-based defect detection of a specimen
- Patent number 11,449,711
- Issue date Sep 20, 2022
- Applied Materials Isreal Ltd
- Ran Badanes
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MACHINE LEARNING-BASED CLASSIFICATION OF DEFECTS IN A SEMICONDUCTOR...
- Publication number 20220222806
- Publication date Jul 14, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING-BASED DEFECT DETECTION OF A SPECIMEN
- Publication number 20210209418
- Publication date Jul 8, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ran BADANES
- G06 - COMPUTING CALCULATING COUNTING