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Oren Cohen
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Holon, IL
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Patents Grants
last 30 patents
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Patent Grant
Defect detection through image comparison using relative measures
Patent number
7,916,286
Issue date
Mar 29, 2011
Applied Materials South East Asia Pte. Ltd.
Erez Sali
G01 - MEASURING TESTING
Information
Patent Grant
Advanced cell-to-cell inspection
Patent number
7,869,643
Issue date
Jan 11, 2011
Applied Materials South East Asia Pte. Ltd.
Zeev Litichever
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect detection through image comparison using relative measures
Patent number
7,369,236
Issue date
May 6, 2008
Negevtech, Ltd.
Erez Sali
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Method and system for speed dating
Publication number
20080228875
Publication date
Sep 18, 2008
Oren Cohen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Advanced cell-to-cell inspection
Publication number
20080181484
Publication date
Jul 31, 2008
Zeev Litichever
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT DETECTION THROUGH IMAGE COMPARISON USING RELATIVE MEASURES
Publication number
20080100844
Publication date
May 1, 2008
Negevtech, Ltd.
Erez Sali
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Defect Detection Through Image Comparison Using Relative Measures
Publication number
20080101686
Publication date
May 1, 2008
NEGEVTECH, LTD.
Erez Sali
G06 - COMPUTING CALCULATING COUNTING