Oren LAHAV

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Adi, IL

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Patents Grantslast 30 patents

Information Patent Grant
System and method for error reduction for metrology measurements
- Patent number 11,353,799
- Issue date Jun 7, 2022
- Roie Volkovich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ptychography based system and method
- Patent number 11,347,045
- Issue date May 31, 2022
- TECHNION RESEARCH AND DEVELOPMEN T FOUNDATION LTD.
- Oren Cohen
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR DETERMINING OVERLAY MEASUREMENT OF A SCANNING...
- Publication number 20240337952
- Publication date Oct 10, 2024
- KLA Corporation
- Itay Gdor
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and Method for Error Reduction for Metrology Measurements
- Publication number 20220155693
- Publication date May 19, 2022
- KLA Corporation
- Roie Volkovich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PTYCHOGRAPHY BASED SYSTEM AND METHOD
- Publication number 20200142175
- Publication date May 7, 2020
- Technion Research & Development Foundation Ltd.
- Oren COHEN
- G02 - OPTICS