Ori Golani

Person

Ramat Gan, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Hybrid scanning electron microscopy and acousto-optic based metrology
- Patent number 12,278,085
- Issue date Apr 15, 2025
- Applied Materials Israel Ltd.
- Guy Shwartz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Depth profiling of semiconductor structures using picosecond ultras...
- Patent number 11,859,963
- Issue date Jan 2, 2024
- Applied Materials Israel Ltd.
- Ori Golani
- G01 - MEASURING TESTING
Information Patent Grant
Multi-perspective wafer analysis
- Patent number 11,815,470
- Issue date Nov 14, 2023
- Applied Materials Israel, Ltd.
- Haim Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Depth profiling of semiconductor structures using picosecond ultras...
- Patent number 11,519,720
- Issue date Dec 6, 2022
- Applied Materials Israel Ltd.
- Ori Golani
- G01 - MEASURING TESTING
Information Patent Grant
Multi-perspective wafer analysis using an acousto-optic deflector
- Patent number 11,195,267
- Issue date Dec 7, 2021
- Applied Materials Israel Ltd.
- Harel Ilan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-perspective examination of a specimen
- Patent number 11,035,803
- Issue date Jun 15, 2021
- Applied Materials Israel Ltd.
- Ido Almog
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ACOUSTIC RESONANCE-BASED METROLOGY OF SAMPLES
- Publication number 20250189435
- Publication date Jun 12, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ori Golani
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR OBTAINING A 3D PROFILE OF A SAMPLE
- Publication number 20250165663
- Publication date May 22, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ido Almog
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEPTH PROFILING OF SEMICONDUCTOR STRUCTURES USING MULTI-WAVELENGTH...
- Publication number 20250155235
- Publication date May 15, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ori Golani
- G01 - MEASURING TESTING
Information Patent Application
MODEL-BASED ACOUSTO-OPTIC DEPTH-METROLOGY OF SPECIMENS
- Publication number 20250116597
- Publication date Apr 10, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Guy Shwartz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYBRID SCANNING ELECTRON MICROSCOPY AND ACOUSTO-OPTIC BASED METROLOGY
- Publication number 20230326713
- Publication date Oct 12, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Guy Shwartz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEPTH PROFILING OF SEMICONDUCTOR STRUCTURES USING PICOSECOND ULTRAS...
- Publication number 20230040995
- Publication date Feb 9, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Ori Golani
- G01 - MEASURING TESTING
Information Patent Application
DEPTH PROFILING OF SEMICONDUCTOR STRUCTURES USING PICOSECOND ULTRAS...
- Publication number 20220113129
- Publication date Apr 14, 2022
- APPLIED MATERIALS ISRAEL, LTD.
- Ori GOLANI
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Hybrid scanning electron microscopy and acousto-optic based metrology

Depth profiling of semiconductor structures using picosecond ultras...

Multi-perspective wafer analysis

Depth profiling of semiconductor structures using picosecond ultras...

Multi-perspective wafer analysis using an acousto-optic deflector

Multi-perspective examination of a specimen

Patents Applicationslast 30 patents

ACOUSTIC RESONANCE-BASED METROLOGY OF SAMPLES

METHODS AND SYSTEMS FOR OBTAINING A 3D PROFILE OF A SAMPLE

DEPTH PROFILING OF SEMICONDUCTOR STRUCTURES USING MULTI-WAVELENGTH...

MODEL-BASED ACOUSTO-OPTIC DEPTH-METROLOGY OF SPECIMENS

HYBRID SCANNING ELECTRON MICROSCOPY AND ACOUSTO-OPTIC BASED METROLOGY

DEPTH PROFILING OF SEMICONDUCTOR STRUCTURES USING PICOSECOND ULTRAS...

DEPTH PROFILING OF SEMICONDUCTOR STRUCTURES USING PICOSECOND ULTRAS...