Ori Petel

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Ramat-Gan, IL

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Patents Grantslast 30 patents

Information Patent Grant
Mask inspection of a semiconductor specimen
- Patent number 11,983,867
- Issue date May 14, 2024
- Applied Materials Israel Ltd.
- Ariel Shkalim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask inspection of a semiconductor specimen
- Patent number 11,348,224
- Issue date May 31, 2022
- Applied Materials Israel Ltd.
- Ariel Shkalim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for printability based inspection
- Patent number 9,927,375
- Issue date Mar 27, 2018
- Applied Materials Israel Ltd.
- Shay Attal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20220254000
- Publication date Aug 11, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Ariel SHKALIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20210073963
- Publication date Mar 11, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ariel SHKALIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR PRINTABILITY BASED INSPECTION
- Publication number 20170176347
- Publication date Jun 22, 2017
- APPLIED MATERIALS ISRAEL, LTD.
- Shay Attal
- G01 - MEASURING TESTING