Ori Shoval

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Ashdod, IL

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Patents Grantslast 30 patents

Information Patent Grant
CD-SEM technique for wafers fabrication control
- Patent number 9,824,852
- Issue date Nov 21, 2017
- Applied Materials Israel Ltd.
- Roman Kris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High electron energy based overlay error measurement methods and sy...
- Patent number 9,046,475
- Issue date Jun 2, 2015
- Applied Materials Israel, Ltd.
- Moshe Langer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CD-SEM TECHNIQUE FOR WAFERS FABRICATION CONTROL
- Publication number 20170194125
- Publication date Jul 6, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G01 - MEASURING TESTING
Information Patent Application
HIGH ELECTRON ENERGY BASED OVERLAY ERROR MEASUREMENT METHODS AND SY...
- Publication number 20120292502
- Publication date Nov 22, 2012
- Moshe Langer
- G01 - MEASURING TESTING